Advances in X-Ray Analysis, V3
Proceedings of the Eighth Annual Conference on Applications of X-Ray Analysis, Held August 12-14, 1959
William M. Mueller(Editor)
Literary Licensing, LLC (Publisher)
Published on 19. May 2012
Book
Hardback
386 pages
978-1-258-34496-2 (ISBN)
More details
Language
English
Place of publication
United States
Product notice
sewn/stitched
Cloth over boards
Dimensions
Height: 229 mm
Width: 152 mm
Thickness: 22 mm
Weight
685 gr
ISBN-13
978-1-258-34496-2 (9781258344962)
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Schweitzer Classification