Advances in X-Ray Analysis: 5
Proceedings of the Tenth Annual Conference on Application of X-Ray Analysis Held August 7-9, 1961
Published on 31. December 1995
Book
Hardback
564 pages
978-0-306-38105-8 (ISBN)
Description
The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado. Approximately 300 participants derived benefit from the presentation of fifty-six papers on new scientific and technological developments in X-ray methods and the discussions that followed. Forty-eight of these papers plus one presented at the Ninth Con- ference and cleared for publication too late to be included in Volume 4 are given here. The growth of the annual conferences and the breadth and intensity of the presentations are confirmations of the observation that the field of X-ray re- search is indeed in a state of rapid and healthy development. Financial assistance provided by the United States Office of Naval Research permitted the participation oftwo distinguished scientists from Europe, Professor Andre Guinier of the University of Paris and Professor Hans Nowotny of the University of Vienna.
More details
Language
English
Place of publication
United States
Publishing group
Springer Science+Business Media
Target group
Professional and scholarly
Illustrations
146 black & white illustrations, biography
ISBN-13
978-0-306-38105-8 (9780306381058)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
William M. Mueller
Advances in X-Ray Analysis
Proceedings of the Tenth Annual Conference on Application of X-Ray Analysis Held August 7-9, 1961
Book
10/2012
Springer
€53.49
Shipment within 15-20 days
Content
Twenty Years of Progress in X-Ray Diffraction Techniques.- Crystal Structure and Stability of Refractory Phases.- X-Ray Diffraction Studies at Low Temperatures.- Low Temperature X-Ray Diffraction of Frozen Electrolytes.- The Lattice Parameters of Iron-Ruthenium Solid-Solution Alloys.- X-Ray Diffraction Investigation of the Sn-Hg Phase in Dental Amalgam.- Determination of Accurate Lattice Parameters Using a Diffractometer.- Precision Lattice-Parameter Determination by Double-Scanning Diffractometry.- Some Recent Developments in the Direct Viewing and High-Speed Recording of X-Ray Diffraction Lines.- The Determination of Crystallite Size and Size Distribution from Broadened X-Ray Diffraction Lines.- Routine Crystallite-Size Determination by X-Ray Diffraction Line Broadening.- A Study of Cuban Todorokite.- X-Ray Studies on the Formation of Basic Lead Azides.- X-Ray Investigations on Some Salts of Hydrazine and Hydrazine Derivatives.- Determination of Zinc Sulfide and Cadmium Sulfide in Solid Solutions of Small Single Crystals Used for Semiconductors by X-Ray and Chemical Methods.- Method for Finding Mass Absorption Coefficients by Empirical Equations and Graphs.- X-Ray Studies of Preferred Orientations and Stress-Strain Relations in Rapidly Deformed Copper.- High Temperature Furnaces for X-Ray Diffractometers.- Selected Applications of High Temperature X-Ray Studies in the Metallurgical Field.- A High Temperature X-Ray Diffractometer Specimen Holder.- Alignment Device and Thermal Control System for High-Temperature X-Ray Diffractometry.- Problems in the Temperature Calibration of an X-Ray Diffractometer Furnace.- Determination of Thermal Expansion by High-Temperature X-Ray Diffraction.- Thermal Expansion of Alpha-Alumina.- Use of a High-Temperature X-Ray Diffractometer to Measure the Temperature Dependence of Reflection Intensities.- Effect of Impurities on Kaolinite Transformations as Examined by High Temperature X-Ray Diffraction.- The Application of X-Ray Diffraction at Elevated Temperatures to Study the Mechanism of Formation of Sodium Tripolyphosphate.- Microanalysis with Ultrasoft X-Radiations.- A Weighted Least Squares Parametric Method of Reducing Nuclear-Reactor Gamma Spectral Data.- Projection Microscopy and Microanalyses.- Heterogeneity Effects in X-Ray Analysis.- The Geometrical Representation of Ternary Alloys and Its Applications to X-Ray Fluorescence and Microprobe Analysis.- Some Considerations on the Excitation Efficiency in X-Ray Spectro-chemical Analysis.- X-Ray Absorption-Edge Determination of Cobalt in Complex Mixtures.- A Simple Multielement-Calibration System for Analysis of Minor and Major Elements in Minerals by Fluorescent X-Ray Spectrography.- Surface Preparation of Solid Metallic Samples for X-Ray Spectro-chemical Analysis.- A Test of the Precision and Sources of Error in Quantitative Analysis of Light, Major Elements in Granitic Rocks by X-Ray Spectrography.- Precision of X-Ray Emission Measurements in the Determination of Low Alloy Steels with an X-Ray Spectrograph.- Determination of Trace Elements in Plant Material by Fluorescent X-Ray Analysis.- Some Special Sample-Mounting Devices for the X-Ray Fluorescence Spectrometer.- The Application of X-Rays to the Analysis of Container Glass.- On Line Type X-Ray Emission Analyzer Systems.- Vacuum X-Ray Instrumentation and Its Application to Mill-Products Control.- Application of X-Ray Fluorescence Analysis to Process Control.- Thin Film X-Ray Spectroscopy.- The X-Ray Spectrographic Analysis of Thin Films by the Milliprobe Technique.- X-Ray Probe with Collimation of the Secondary Beam.- Electron Probe X-Ray Spectrograph: Design, Evaluation, and Application.- Equipment for Beam Scanning and Step Scanning in Electron Probe Analysis.- Author Index.