Protocol Test Systems
7th workshop 7th IFIP WG 6.1 international workshop on protocol text systems
Published on 30. June 1995
Book
Hardback
X, 348 pages
978-0-412-71160-2 (ISBN)
Description
This is the Proceedings of the 7th IFIP WG6.1 International Workshop on Protocol Test Systems (IWPTS'94) which was held in Tokyo, Japan on November 8-10, 1994. After having been organized in Vancouver (Canada, 1988), Berlin (Germany, 1989), McLean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992) and Pau (France, 1993), this is the 7th international workshop. The aim of the workshop is to be a meeting point between research and industry and between theory and practice of the testing of data communication systems. The workshop consists of the presentations of reviewed and invited papers, tool demonstrations and panel sessions. All submitted papers have been reviewed by the members of the Program Committee and the following additional reviewers including: L. Andrey, N. Arakawa, D. Becam, L. Boullier, R. Dssouli, B. Forghani, M. Higuchi, L. Heerink, G. Huecas, M. Hunter, S. lisaku, Y. Kakuda, K. Kazama, L-S. Koh , R. Langerak, D. Lee, G. Leon, G. Luo, P. Maigron, M. Mori, A. Nakamura, S. Nightingale, K. Okada, K. Okano, N. Okazaki, A. Petrenko, M. Phalippou, A. Rennoch, F. Sato, Y. Sugito, D. Tang, D. Toggweiler, F. Vallo and J. Zhu.
The Program Committee has selected excellent papers among them. This proceedings includes two invited papers, fifteen regular papers, six short papers, two panel reports and one panel paper which were presented in the workshop.
The Program Committee has selected excellent papers among them. This proceedings includes two invited papers, fifteen regular papers, six short papers, two panel reports and one panel paper which were presented in the workshop.
More details
Series
Edition
1995 ed.
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Research
Product notice
sewn/stitched
Cloth over boards
Illustrations
X, 348 p.
Dimensions
Height: 234 mm
Width: 156 mm
Thickness: 21 mm
Weight
680 gr
ISBN-13
978-0-412-71160-2 (9780412711602)
DOI
10.1007/978-0-387-34883-4
Schweitzer Classification
Other editions
Additional editions
Tadanori Mizuno | Teruo Higashino | Norio Shiratori
Protocol Test Systems
7th workshop 7th IFIP WG 6.1 international workshop on protocol text systems
Book
01/2013
Springer
€160.49
Shipment within 15-20 days
Content
1 Open issues in conformance test specification.- 2 OSI protocol testing system based on user friendly test scenario specification functions.- 3 TTCN test case correctness validation.- 4 Fault coverage of tests based on finite state models.- 5 On transition time testing based on extended finite state machines.- 6 Selecting test sequences for partially-specified nondeterministic finite state machines.- 7 An optimal state identification method using a dynamic-programming-based approach for protocol testing.- 8 The present status of conformance testing and interoperability testing.- 9 Design and implementation of an interconnectability testing system - AICTS.- 10 Evaluation of some test generation tools on a real protocol example.- 11 Protocol validation tools as test case generators.- 12 Framework for formal methods in conformance testing.- 13 Testing strategies for communicating FSMs.- 14 A generalization of the multiple UIO method of test sequence selection for protocols represented in FSM.- 15 Automatic generation of extended UIO sequences for communication protocols in an EFSM model.- 16 A new test sequence generation method for interoperability testing.- 17 How to observe interoperability at the service level of protocols.- 18 Testing using telecommunications management.- 19 An implementation of CMIP/CMISE conformance testing system.- 20 A conformance testing framework for applying test purposes.- 21 Implementation of TTCN operational semantics in Estelle.- 22 An approach to TTCN-based test execution.- 23 Time oriented protocol testing simulator.- 24 On the exploitation of parallelism in a test generation method for LOTOS-specifications.- 25 Panel on some issues on testing theory and its application.- 26 Some issues on testing theory and its application.- Index ofcontributors.- Keyword index.