Particles on Surfaces
Detection: Adhesion, and Removal
1st Edition
Published on 16. December 1994
Book
Hardback
438 pages
978-0-8247-9535-1 (ISBN)
Description
This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.
More details
Language
English
Place of publication
Bosa Roca
United States
Publishing group
Taylor & Francis Inc
Target group
College/higher education
Professional and scholarly
Dimensions
Height: 234 mm
Width: 156 mm
Weight
816 gr
ISBN-13
978-0-8247-9535-1 (9780824795351)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
E-Book
08/2020
1st Edition
CRC Press
€291.99
Available for download
E-Book
08/2020
1st Edition
CRC Press
€291.99
Available for download
Person
K.L.Mittal
Content
Particles on surfaces - adhesion induced deformations; surface force tensile interactions between micrometer size particles and a polyester-PDMS block copolymer substrate; polymer to particle adhesion probed with atomic force microscopy; surface particle contamination identification in microelectronics; an overview of spacecraft particulate contamination phenomena; contamination on optical surfaces-concerns, prevention, detection, and removal; an advanced surface particle and molecular contaminant identification, removal, and collection system; the role of air ionization in reducing surface contamination by particles in the cleanroom; selecting a contamination-free deburring process - testing abrasive blasting media; particle generation and control in tubing and piping connection design; detection and identification of particles on silicon surfaces; the characterization of particles on spacecraft returned from orbit; a light-scattering method for determining the composition of particles on surfaces; light scattering by spherical particles on planar multi-layered substrates; new test procedure for the examination of the particulate cleanliness of technical surfaces; discrimination between particulate and film type contamination on surfaces by means of total reflection X-ray fluorescence spectrometry; particle characterization on surfaces by Auger electron spectroscopy; interrogating the behavior of micrometer-sized particles on surfaces with focused acoustic waves; removal of glass particles from glass surfaces - a review; particle removal characteristics of surface cleaning methods involving sonication and/or spray impingement; fluid dynamics of liquid jets used for particle removal from surfaces; enhanced particle removal from inertial guidance instrument parts by fluorocarbon surfactant solutions; laser cleaning techniques for the removal of small surface particulates.