
Transmission Electron Microscopy of Minerals and Rocks
Alex C. McLaren(Author)
Cambridge University Press
2nd Edition
Published on 29. September 2005
Book
Paperback/Softback
400 pages
978-0-521-35943-6 (ISBN)
Description
Of the many techniques that have been applied to the study of crystal defects, none has contributed more to our understanding of their nature and influence on the physical and chemical properties of crystalline materials than transmission electron microscopy (TEM). TEM is now used extensively by an increasing number of earth scientists for direct observation of defect microstructures in minerals and rocks. Transmission Electron Microscopy of Minerals and Rocks is an introduction to the principles of the technique written specifically for geologists and mineralogists. The first part of the book deals with the essential physics of the transmission electron microscope and presents the basic theoretical background required for the interpretation of images and electron diffraction patterns. A knowledge of elementary crystallography is assumed, and some familiarity with optics and electromagnetic theory is helpful but not essential. The final chapters are concerned with specific applications of TEM in mineralogy and deal with such topics as planar defects, intergrowths, radiation-induced defects, dislocations and deformation-induced microstructures.
Reviews / Votes
"...a welcome addition to the literature....is suitably authoritative and comprehensive....a very fine book, with many unique and worth-while features....will prove to be invaluable to any worker in the field, and should be in every Earth Science library." David Price, Geological MagazineMore details
Series
Edition
2nd Revised edition
Language
English
Place of publication
Cambridge
United Kingdom
Target group
Professional and scholarly
College/higher education
Edition type
Revised edition
Product notice
Paperback (trade)
Illustrations
Worked examples or Exercises
Dimensions
Height: 229 mm
Width: 152 mm
Thickness: 23 mm
Weight
647 gr
ISBN-13
978-0-521-35943-6 (9780521359436)
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Schweitzer Classification
Other editions
Additional editions

Alex C. McLaren
Transmission Electron Microscopy of Minerals and Rocks
Book
04/1991
2nd Edition
Cambridge University Press
€198.80
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Person
Content
Preface; Introduction; 1. Principles of image formation by a lens; 2. The transmission electron microscope; 3. Kinematical theory of electron diffraction; 4. Dynamical theory of electron diffraction; 5. The observation of crystal defects; 6. High-resolution transmission electron microscopy; 7. Chemical analysis in the transmission electron microscope; 8. Mineralogical applications of TEM - I: defects and microstructures in undeformed specimens; 9. Mineralogical applications of TEM - II: dislocations and microstructures associated with deformation; References; Index.