
Natural Image Statistics in Digital Image Forensics
Siwei Lyu(Author)
VDM Verlag Dr. Mueller E.K.
Published on 7. February 2008
Book
Paperback/Softback
112 pages
978-3-8364-5553-4 (ISBN)
More details
Language
English
Place of publication
Germany
Product notice
Paperback (trade)
Unsewn / adhesive bound
Dimensions
Height: 244 mm
Width: 170 mm
Thickness: 6 mm
Weight
191 gr
ISBN-13
978-3-8364-5553-4 (9783836455534)
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Schweitzer Classification