Defect Analysis in Electron Microscopy
Published in February 1976
Book
Paperback/Softback
144 pages
978-0-412-13770-9 (ISBN)
More details
Series
Language
English
Place of publication
London
United Kingdom
Illustrations
76ill.
Dimensions
Height: 250 mm
Width: 160 mm
ISBN-13
978-0-412-13770-9 (9780412137709)
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Schweitzer Classification