Defect Analysis in Electron Microscopy
Chapman and Hall (Publisher)
Published in February 1976
Book
Hardback
144 pages
978-0-412-13760-0 (ISBN)
More details
Language
English
Place of publication
London
United Kingdom
Illustrations
76ill.
Dimensions
Height: 250 mm
Width: 160 mm
ISBN-13
978-0-412-13760-0 (9780412137600)
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Schweitzer Classification