
Selected Semiconductor Research
Ming Fu Li(Author)
Imperial College Press
Published on 3. March 2011
Book
Hardback
528 pages
978-1-84816-406-2 (ISBN)
Description
This unique volume assembles the author's scientific and engineering achievements of the past three decades in the areas of (1) semiconductor physics and materials, including topics in deep level defects and band structures, (2) CMOS devices, including the topics in device technology, CMOS device reliability, and nano CMOS device quantum modeling, and (3) Analog Integrated circuit design. It reflects the scientific career of a semiconductor researcher educated in China during the 20th century. The book can be referenced by research scientists, engineers, and graduate students working in the areas of solid state and semiconductor physics and materials, electrical engineering and semiconductor devices, and chemical engineering.
More details
Language
English
Place of publication
London
United Kingdom
Target group
College/higher education
Professional and scholarly
Researchers, professors, graduate students, postdoctorates, engineers in the areas of solid state physics, semiconductor electron devices, materials science, chemical engineering, circuit design.
Dimensions
Height: 235 mm
Width: 157 mm
Thickness: 33 mm
Weight
907 gr
ISBN-13
978-1-84816-406-2 (9781848164062)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Person
Content
Defects in Semiconductors; Semiconductor Band Structures; Analog Integrated Circuit Design; CMOS Device Reliability; CMOS Technology; Nano CMOS Device Quantum Simulation.