Boundary Value Problems with Equivalued Surface and Resistivity Well-Logging
1st Edition
Published on 25. March 1998
Book
Hardback
224 pages
978-0-582-27632-1 (ISBN)
Description
This first part of this book deals with the boundary value problem with equivalued surfaces, while the second part is concerned with the mathematical model and method, including the numerical method, of the resistivity well-logging for the three-lateral well-logging.
More details
Series
Language
English
Place of publication
London
United Kingdom
Publishing group
Taylor & Francis Ltd
Target group
College/higher education
Professional and scholarly
Dimensions
Height: 280 mm
Width: 210 mm
Weight
635 gr
ISBN-13
978-0-582-27632-1 (9780582276321)
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Schweitzer Classification
Persons
Li\, T; Zheng\, Songmu; Tan\, Yong-Si; Shen\, Weixi
Content
Preface.
Part I - Boundary Value Problems with Equivalued Surface: Physical Sources forBoundary Value Problems with Equivalued Surface. Existence and Uniqueness of Solutions. Limit Behaviour of Solutions. Homogenization of Boundary Conditions. Parameter Identification Problems. A Class of Nonlinear and Nonlocal Boundary Value Problems and Limit Behaviour of Solutions. Boundary Value Problems with Equivalued Surface for Semilinear Elliptic Equations. Generalization and Further Applications.
Part II - Resistivity Well-Logging: Numerical Solutions to the Boundary Value Problem with Equivalued Surface. Dual Laterolog. Microspheric Focusing Well-Logging.
Part I - Boundary Value Problems with Equivalued Surface: Physical Sources forBoundary Value Problems with Equivalued Surface. Existence and Uniqueness of Solutions. Limit Behaviour of Solutions. Homogenization of Boundary Conditions. Parameter Identification Problems. A Class of Nonlinear and Nonlocal Boundary Value Problems and Limit Behaviour of Solutions. Boundary Value Problems with Equivalued Surface for Semilinear Elliptic Equations. Generalization and Further Applications.
Part II - Resistivity Well-Logging: Numerical Solutions to the Boundary Value Problem with Equivalued Surface. Dual Laterolog. Microspheric Focusing Well-Logging.