Mems Reliability For Critical Applications
Lawton(Author)
SPIE Press
Published on 1. January 2000
Book
Paperback/Softback
152 pages
978-0-8194-3836-2 (ISBN)
More details
Language
English
Place of publication
Bellingham
United States
Target group
Professional and scholarly
Weight
366 gr
ISBN-13
978-0-8194-3836-2 (9780819438362)
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Schweitzer Classification