Quantitative Description of Microstructure of Mtls
1st Edition
Published on 21. July 1995
Book
Hardback
430 pages
978-0-8493-8921-4 (ISBN)
Description
This book, the product of a deep collaboration between the two authors, strikes a balance between the traditional approach and newly emerging techniques used to obtain a quantitative description of the microstructure of materials.
The Quantitative Description of the Microstructure of Materials has a unique format that sets it apart from other books. The first half of the book gives a comprehensive account of the entire quantification process and presents material in a pedagogical style. Numerous examples appear throughout text to illustrate the methodology. A general introduction to the subject and basic concepts, definitions, techniques, and relationships are provided. Aspects of modern stereology are described in detail. Image processing, computer aided procedures of data analysis, and the elements of a system for image analysis also are discussed at length.
The remaining chapters treat a series of significant examples in much more detail. This part of text offers information in an easy-to-access reference style, making it extremely useful as a guide to active researchers in the quantification guide. Topics include dislocations, internal and external surfaces, and quantitative characterization of thin film structures. The book covers geometry of grains and its effect on the properties of polycrystals. Particles, pores, and other isolated volumetric elements of the microstructure also are discussed.
The Quantitative Description of the Microstructure of Materials has a unique format that sets it apart from other books. The first half of the book gives a comprehensive account of the entire quantification process and presents material in a pedagogical style. Numerous examples appear throughout text to illustrate the methodology. A general introduction to the subject and basic concepts, definitions, techniques, and relationships are provided. Aspects of modern stereology are described in detail. Image processing, computer aided procedures of data analysis, and the elements of a system for image analysis also are discussed at length.
The remaining chapters treat a series of significant examples in much more detail. This part of text offers information in an easy-to-access reference style, making it extremely useful as a guide to active researchers in the quantification guide. Topics include dislocations, internal and external surfaces, and quantitative characterization of thin film structures. The book covers geometry of grains and its effect on the properties of polycrystals. Particles, pores, and other isolated volumetric elements of the microstructure also are discussed.
More details
Language
English
Place of publication
Bosa Roca
United States
Publishing group
Taylor & Francis Inc
Target group
College/higher education
Professional and scholarly
Professional
Illustrations
241 figs., 36 tabs.
Dimensions
Height: 234 mm
Width: 156 mm
Weight
915 gr
ISBN-13
978-0-8493-8921-4 (9780849389214)
Schweitzer Classification
Persons
Kurzydlowski\, Krzysztof Jan; Ralph\, Brian
Content
Introduction
Elements of the Microstructures of Materials
Size and Shape
The Influence of Microstructure on the Properties of Materials
Stochastic Character of the Geometry of Microstructures
Observations of the Microstructure of Materials
About the Book
Rerferences
Basic Concepts, Definitions, Techniques, and Relationships
Populations, Individual Microstructural Elements, and Distribution Functions
Distribution Functions
Parameters of the Populations
Normal and Log-Normal Distribution
Sampling
Size of the Samples
Microstructural Homogeneity
General Characterization of Material Microstructures
Geometrical Probing
Random and Oriented Sections
Random Oriented Lines
Point Testing
Number and Weighted Distributions
Notation
Volume Fraction Determination
Density of Two-Dimensional Features in Space
Density of Lines on a Plane
Density of Lines in Space
Density of Elements and Average Properties
Modification for Anisotropic Lines and Surfaces
Anisotropic Distribution of Lines
Estimation of the Density of Volume Elements, NV, by a Method of Size Distribution Reconstruction
Description of Particle Agglomeration
Curvature of Lines on a Plane
References
Modern Stereology
Disector-New Approach to Particle Density
Selector-Particle Volume Distribution
Point Sampled Intercepts
Second Order Statistics-Methods for Estimating the Variance of Particle Volume
Fractionator
Nucleator
Vertical Sectioning-Area of the Surfaces
Orientator
Trisector
References
Computer Aided Characterization of the Microstructures of Materials
Image Processing
Computer Aided Procedures of Data Analysis
Elements of a System for Image Analysis
References
Characterization of Linear and Planar Elements of Microstructures
Dislocations
Internal Surfaces
External Surfaces
Quantitative Characterization of Thin Film Structures
References
The Geometry of
Elements of the Microstructures of Materials
Size and Shape
The Influence of Microstructure on the Properties of Materials
Stochastic Character of the Geometry of Microstructures
Observations of the Microstructure of Materials
About the Book
Rerferences
Basic Concepts, Definitions, Techniques, and Relationships
Populations, Individual Microstructural Elements, and Distribution Functions
Distribution Functions
Parameters of the Populations
Normal and Log-Normal Distribution
Sampling
Size of the Samples
Microstructural Homogeneity
General Characterization of Material Microstructures
Geometrical Probing
Random and Oriented Sections
Random Oriented Lines
Point Testing
Number and Weighted Distributions
Notation
Volume Fraction Determination
Density of Two-Dimensional Features in Space
Density of Lines on a Plane
Density of Lines in Space
Density of Elements and Average Properties
Modification for Anisotropic Lines and Surfaces
Anisotropic Distribution of Lines
Estimation of the Density of Volume Elements, NV, by a Method of Size Distribution Reconstruction
Description of Particle Agglomeration
Curvature of Lines on a Plane
References
Modern Stereology
Disector-New Approach to Particle Density
Selector-Particle Volume Distribution
Point Sampled Intercepts
Second Order Statistics-Methods for Estimating the Variance of Particle Volume
Fractionator
Nucleator
Vertical Sectioning-Area of the Surfaces
Orientator
Trisector
References
Computer Aided Characterization of the Microstructures of Materials
Image Processing
Computer Aided Procedures of Data Analysis
Elements of a System for Image Analysis
References
Characterization of Linear and Planar Elements of Microstructures
Dislocations
Internal Surfaces
External Surfaces
Quantitative Characterization of Thin Film Structures
References
The Geometry of