
A Deep Learing Approach for On-Site Plant Leaf Detection
Scholars' Press
Published on 28. April 2026
Book
Paperback/Softback
88 pages
978-620-9-94538-0 (ISBN)
Description
Proposed System shows usefulness of integration of an image analyzer aided with pattern recognition within a diagnostic expert system model. In order to diagnose a disorder from leaf image four image processing phases have to be applied: Image enhancement, Image segmentation, Feature extraction, & classification. In order to employ proposed system we first have to train it with a set of images of disorders. Applying this model to any other crop disorder requires only spatial care to be taken in order to acquire a sufficient set of images for training purpose as representative of these disorders. Due to integration of this proposed system diagnosis accuracy will increase. Proposed system focuses on specific disorder's identification, it can be extended in order to include more disorders.
More details
Language
English
Product notice
Paperback (trade)
Unsewn / adhesive bound
Dimensions
Height: 220 mm
Width: 150 mm
Thickness: 6 mm
Weight
149 gr
ISBN-13
978-620-9-94538-0 (9786209945380)
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Schweitzer Classification
Persons
Dr. M. Aravind Kumar obtained B. Tech Degree in ECE, M.Tech Degree in VLSI System Design from JNTUH, and Ph.D. from GITAM University, Visakhapatnam. He has 15 years of teaching experience. He is a Life member of FIE, ISTE, IETE, SCIEI, UACEE, and IAENG. He Published 45 Research Papers in refereed Journals and Conferences.