Reliability, Packaging, Testing, and Characterization of Mems/moems and Nanodevices IX
Published on 1. January 2010
Book
Paperback/Softback
344 pages
978-0-8194-7988-4 (ISBN)
More details
Language
English
Place of publication
Bellingham
United States
Target group
Professional and scholarly
Illustrations
Illustrations
Dimensions
Height: 229 mm
Width: 152 mm
ISBN-13
978-0-8194-7988-4 (9780819479884)
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Schweitzer Classification