
Data-driven Methods for Fault Localization in Process Technology
Christian Kühnert(Author)
KIT Scientific Publishing
Published on 22. May 2014
Book
Paperback/Softback
XVIII, 224 pages
978-3-7315-0098-8 (ISBN)
Description
Control systems at production plants consist of a large number of process variables. When detecting abnormal behavior, these variables generate an alarm. Due to the interconnection of the plant\'s devices the fault can lead to an alarm flood. This again hides the original location of the causing device. In this work several data-driven approaches for root cause localization are proposed, compared and combined. All methods analyze disturbed process data for backtracking the propagation path.
More details
Series
Thesis
Doctoral thesis
2013
Karlsruher Institut für Technologie, KIT
Language
English
Product notice
Paperback (trade)
Unsewn / adhesive bound
Illustrations
graph. Darst.
Dimensions
Height: 210 mm
Width: 148 mm
Thickness: 15 mm
Weight
331 gr
ISBN-13
978-3-7315-0098-8 (9783731500988)
DOI
10.5445/KSP/1000036427
Schweitzer Classification