Recent Advances in X-ray Characterization of Materials
Published in May 1989
Book
Hardback
278 pages
978-0-08-037368-3 (ISBN)
Description
X-rays have been used by physicists, chemists, metallurgists, biologists, crystallographers and materials scientists to study a wide range of materials. Consequently, the results of such research are widely scattered throughout a variety of scientific journals of different disciplines. This second volume of Recent Advances in X-ray Characterization of Materials , together with the first volume published in 1987, reviews the scientific literature, presenting the results in a form especially convenient for the scientist seeking information on research in disciplines other than his own.
X-rays have been used by physicists, chemists, metallurgists, biologists, crystallographers and materials scientists to study a wide range of materials. Consequently, the results of such research are widely scattered throughout a variety of scientific journals of different disciplines. This second volume of Recent Advances in X-ray Characterization of Materials , together with the first volume published in 1987, reviews the scientific literature, presenting the results in a form especially convenient for the scientist seeking information on research in disciplines other than his own.
X-rays have been used by physicists, chemists, metallurgists, biologists, crystallographers and materials scientists to study a wide range of materials. Consequently, the results of such research are widely scattered throughout a variety of scientific journals of different disciplines. This second volume of Recent Advances in X-ray Characterization of Materials , together with the first volume published in 1987, reviews the scientific literature, presenting the results in a form especially convenient for the scientist seeking information on research in disciplines other than his own.
More details
Series
Language
English
Place of publication
Amsterdam
Netherlands
Publishing group
Elsevier Science & Technology
Target group
College/higher education
Professional and scholarly
Dimensions
Height: 260 mm
ISBN-13
978-0-08-037368-3 (9780080373683)
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Schweitzer Classification
Content
Small-angle scattering of X-rays, H B Stuhrmann. X-ray diffraction studies of thin films and multilayer structures, A Segmuller, I C Noyan & V S Speri;su. EXAFS of catalytic materials, G Sankar, G U Kulkarni & C N R Rao; Application of X-ray energy-dispersive diffraction for characterization of materials under high pressure, B Buras & L Geward.;The characterization of modulated structures via their diffraction patterns, R L Withers. Applications of the divergent beam X-ray technique, S Weissmann & L H Lee. ;X-ray scattering from point defect aggregates in single crystals, K Lal. Compound index. Subject index.