
Nanocharacterisation
Royal Society of Chemistry (Publisher)
2nd Edition
Published on 24. August 2015
Book
Hardback
358 pages
978-1-84973-805-7 (ISBN)
Description
Nanocharacterisation provides an overview of the main characterisation techniques that are currently used to study nanostructured materials. Following on from the success of the first edition, this new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods. With contributions from internationally recognised experts, each chapter focuses on a different technique to characterise nanomaterials providing experimental procedures and applications. State of the art characterisation methods covered include Transmission Electron Microscopy, Scanning Transmission Electron Microscopy, Scanning Probe Microscopy, Electron Energy Loss Spectroscopy and Energy Dispersive X-ray Analysis, 3D Characterisation, Scanning Electron and Ion Microscopy and In situ Microscopy. Essentially a handbook to all working in the field this indispensable resource will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology.
Reviews / Votes
This text contains very well-referenced chapters on the newest advances in nanoscale imaging and microscopy and would be a welcome addition to the shelf of any research microscopist who wishes to venture beyond the conventional boundaries of these techniques. "A very interesting and useful publication indeed, with a content according to a very high scientific standard."More details
Series
Edition
2nd edition
Language
English
Place of publication
Cambridge
United Kingdom
Target group
Professional and scholarly
Product notice
Unsewn / adhesive bound
Dimensions
Height: 236 mm
Width: 160 mm
Thickness: 19 mm
Weight
680 gr
ISBN-13
978-1-84973-805-7 (9781849738057)
DOI
10.1039/9781782621867
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions

Angus I. Kirkland | Sarah J. Haigh
Nanocharacterisation
E-Book
08/2015
2nd Edition
Royal Society of Chemistry
€235.99
Available for download

Angus I. Kirkland | Sarah J. Haigh
Nanocharacterisation
E-Book
08/2015
2nd Edition
Royal Society of Chemistry
€235.99
Available for download
Previous edition

Angus I. Kirkland | Sarah Haigh
Nanocharacterisation
Book
08/2007
Royal Society of Chemistry
€231.50
Article not available at the moment
Persons
A I Kirkland is Professor of Materials at Oxford University and the author of over 170 refereed papers. He was awarded "best materials paper" of 2005 by the Microscopy Society of America. Since 2000 he has also been involved in the characterisation of CCD cameras for TEM. His most recent work involves the development of approaches to complex phase extension and diffractive imaging to further improve resolution.
Content
Characterization of Nanomaterials using Transmission Electron Microscopy;
Characterization of Nanomaterials using Scanning Transmission Electron Microscopy;
Scanning Probe Microscopy of Nanostructures;
Electron Energy Loss Spectroscopy and Energy Dispersive X-ray Analysis in Nanostructure Characterisation;
Measurements of Fields in Nanostructures;
3D Characterisation of Nanostructures;
Scanning Electron and Ion Microscopy at the Nanoscale;
In situ Microscopy of Nanomaterials;
Characterization of Nanomaterials using Scanning Transmission Electron Microscopy;
Scanning Probe Microscopy of Nanostructures;
Electron Energy Loss Spectroscopy and Energy Dispersive X-ray Analysis in Nanostructure Characterisation;
Measurements of Fields in Nanostructures;
3D Characterisation of Nanostructures;
Scanning Electron and Ion Microscopy at the Nanoscale;
In situ Microscopy of Nanomaterials;