
Scanning Electron Microscope Optics And Spectrometers
Anjam Khursheed(Author)
World Scientific Publishing Co Pte Ltd
Published on 3. November 2010
Book
Hardback
416 pages
978-981-283-667-0 (ISBN)
Description
This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself.The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.
More details
Language
English
Place of publication
Singapore
Singapore
Target group
College/higher education
Professional and scholarly
Surface scientists, electron microscopists, materials scientists and engineers, and graduate students who are interested in scanning electron microscope or charged particle spectrometer and its redesign.
Dimensions
Height: 235 mm
Width: 157 mm
Thickness: 27 mm
Weight
753 gr
ISBN-13
978-981-283-667-0 (9789812836670)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Person
Content
Introduction; Conventional SEM Design; Objective Lens Improvements; Abberation Correction for SEM; Electron Spectrometers and Filters; Secondary Electron Spectrometers; Auger Electron Spectrometers; Backscattered Electron Spectrometers; An Add-on Transmission Electron Energy Loss Spectrometer Attachment; Full-Range Energy Spectrometer Designs; A Multi-beam Spectra-Microscope Proposal.