Pattern Recognition and Artificial Intelligence, Towards an Integration: Volume 7
Proceedings of an International Workshop held in Amsterdam, May 18-20, 1988
Published on 1. November 1988
Book
Hardback
510 pages
978-0-444-87137-4 (ISBN)
Description
This volume brings together the results of research into the methodology and applications of pattern recognition, with particular emphasis given to the incorporation of artificial intelligence methodologies into pattern recognition systems.The first part of this volume covers image analysis and processing software, systems and algorithms. Pattern analysis and classifier design are dealt with in part two, while the last part deals with model based and expert systems, including uncertainty calculus methods in pattern analysis and object recognition. A number of specific application areas are considered, including such diverse topics as fingerprinting, astronomy, molecular biology and pathology.
More details
Series
Language
English
Place of publication
United States
Publishing group
Elsevier Science & Technology
Target group
College/higher education
Professional and scholarly
ISBN-13
978-0-444-87137-4 (9780444871374)
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Schweitzer Classification
Other editions
Additional editions
L. N. Kanal | E. S. Gelsema
Pattern Recognition and Artificial Intelligence, Towards an Integration
Proceedings of an International Workshop held in Amsterdam, May 18-20, 1988
E-Book
06/2014
Elsevier
€54.95
Available for download
Persons
Content
Part I: Image Processing. Image Processing Systems: (Contributors: R. Bartels, P. Dewaele, A. Oosterlinck, E.H.J. Persoon, R. Roos, J. Vandeneede, D. van den Oudenhoven, P. Wambacq, I.T. Young). Image Processing Algorithms: (Contributors: G.L. Beckers, J. Biguen, P.-E. Danielsson, A.C.M. Dumay, C.A. Essed, A. Falsafi, J.J. Gerbrands, F.C.A. Groen, W.A. Levenbach, H. Minderhoud, G. Nagy, H. Peng, J.H.C. Reiber, K.J. Rijnierse, P.W. Serruys, A.W.M. Smeulders, H. Stark, G.T. Toussaint, P.J.H. van Cuyck, L.J. van Vliet, M. Worring, Q.-Z. Ye, I.T. Young, F. Zijlstra).
Part II: Pattern Recognition (Contributors: E. Backer, R.P.W. Duin, E.S. Gelsema, A.K. Jain, M.J. Kurtz, S.D. Morgera, C.E. Queiros, M.D. Ramaswami, K. Siedlecka, W. Siedlecki, J. Sklansky, M.R. Soleymani, T. Timmers).
Part III: Artificial Intelligence and Pattern Recognition (Contributors: E. Backer, R.K. Bhatnagar, C. Cocca, B.M. Dawant, B. Dubuisson, J. Gordon, G. Harauz, J. Ireland, B.H. Jansen, M.M. Jordan, L.N. Kanal, D. McDougall, E. Mandler, M.A. Musen, A. Oosterlinck, W.J. Perkins, J. Piper, J. Schuermann, C. Smets, A.W.M. Smeulders, P. Suetens, S. Towers, J. van der Lei, A.M. van Ginneken, G. Verbeeck).
Discussions. Index.
Part II: Pattern Recognition (Contributors: E. Backer, R.P.W. Duin, E.S. Gelsema, A.K. Jain, M.J. Kurtz, S.D. Morgera, C.E. Queiros, M.D. Ramaswami, K. Siedlecka, W. Siedlecki, J. Sklansky, M.R. Soleymani, T. Timmers).
Part III: Artificial Intelligence and Pattern Recognition (Contributors: E. Backer, R.K. Bhatnagar, C. Cocca, B.M. Dawant, B. Dubuisson, J. Gordon, G. Harauz, J. Ireland, B.H. Jansen, M.M. Jordan, L.N. Kanal, D. McDougall, E. Mandler, M.A. Musen, A. Oosterlinck, W.J. Perkins, J. Piper, J. Schuermann, C. Smets, A.W.M. Smeulders, P. Suetens, S. Towers, J. van der Lei, A.M. van Ginneken, G. Verbeeck).
Discussions. Index.