
Degradation Processes in Reliability
Wiley-ISTE (Publisher)
1st Edition
Published on 7. June 2016
Book
Hardback
240 pages
978-1-84821-888-8 (ISBN)
Description
"Degradation process" refers to many types of reliability models, which correspond to various kinds of stochastic processes used for deterioration modeling. This book focuses on the case of a univariate degradation model with a continuous set of possible outcomes. The envisioned univariate models have one single measurable quantity which is assumed to be observed over time.
The first three chapters are each devoted to one degradation model. The last chapter illustrates the use of the previously described degradation models on some real data sets. For each of the degradation models, the authors provide probabilistic results and explore simulation tools for sample paths generation. Various estimation procedures are also developed.
The first three chapters are each devoted to one degradation model. The last chapter illustrates the use of the previously described degradation models on some real data sets. For each of the degradation models, the authors provide probabilistic results and explore simulation tools for sample paths generation. Various estimation procedures are also developed.
Reviews / Votes
"The main focus of the book is on parametric models. In such a case likelihood maximization is recommended as the main estimation method. The form of the likelihood function is always rigorously derived and the procedure of its maximization is discussed. If the covariance matrix of ML estimates is sufficiently simple, it is also presented. For some models, estimation by the method of moments is described; the corresponding equations are then also rigorously derived. The book also contains very detailed descriptions of various methods for simulation of considered degradation processes." (Mathematical Reviews/MathSciNet April 2017)More details
Language
English
Place of publication
London
United Kingdom
Target group
Professional and scholarly
Product notice
sewn/stitched
Cloth over boards
Dimensions
Height: 240 mm
Width: 161 mm
Thickness: 18 mm
Weight
531 gr
ISBN-13
978-1-84821-888-8 (9781848218888)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions

Waltraud Kahle | Sophie Mercier | Christian Paroissin
Degradation Processes in Reliability
E-Book
06/2016
Wiley-ISTE
€139.99
Available for download

Waltraud Kahle | Sophie Mercier | Christian Paroissin
Degradation Processes in Reliability
E-Book
06/2016
Wiley-ISTE
€139.99
Available for download
Persons
Waltraud Kahle is Associate Professor in the Mathematics Department of the Otto-von-Guericke University Magdeburg in Germany.
Sophie Mercier is Full Professor in the Laboratory of Mathematics and their Applications of the University of Pau and Pays de l'Adour in France.
Christian Paroissin is Associate Professor in the Laboratory of Mathematics and their Applications of the University of Pau and Pays de l'Adour in France.
Sophie Mercier is Full Professor in the Laboratory of Mathematics and their Applications of the University of Pau and Pays de l'Adour in France.
Christian Paroissin is Associate Professor in the Laboratory of Mathematics and their Applications of the University of Pau and Pays de l'Adour in France.
Author
University Magdeburg, Germany
University of Pau and Pays de l'Adour, France
University of Pau and Pays de l'Adour, France
Content
Introduction
1. Wiener Processes
2. Gamma Processes
3. Doubly Stochastic Marked Poisson Processes
4. Model Selection and Application to Real Data Sets
1. Wiener Processes
2. Gamma Processes
3. Doubly Stochastic Marked Poisson Processes
4. Model Selection and Application to Real Data Sets