
Microstructural Investigation and Analysis
Wiley-VCH (Publisher)
1st Edition
Published on 20. April 2000
Book
Hardback
338 pages
978-3-527-30121-8 (ISBN)
from
€129.00
Article is exhausted; no reprint
Description
Modern understanding of materials include the approach at the microscopic or nanometric level. In the best case, imaging at the atomic level is possible. These approaches are essential for instance in the exploration of interfaces, surfaces and defects in crystals. Several aspects can be explored, the microstructure, local element composition, and chemical bonds.
This book presents the state-of-the-art of modern investigation methods of materials.
This book presents the state-of-the-art of modern investigation methods of materials.
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More details
Series
Edition
1., Aufl.
Language
English
Place of publication
Weinheim
Germany
Target group
College/higher education
Professional and scholarly
Illustrations
150
50 s/w Tabellen, 150 s/w Abbildungen
Illustrations
Dimensions
Height: 24 cm
Width: 17 cm
Weight
686 gr
ISBN-13
978-3-527-30121-8 (9783527301218)
Schweitzer Classification
Content
Scanning and transmission electron microscopy; convergent beam electron diffraction; x-ray characterization; EELS; x-ray synchrotron radiation (EXAFS, XANES); SIMS; auger microscopy; PIXE; near field microscopy.