Residual Stresses: A Review of Their Measurement and Interpretation Using X-Ray Diffraction
A.M. Jones(Author)
AEA Technology (Publisher)
Published on 31. December 1989
Book
Paperback/Softback
33 pages
978-0-7058-1522-2 (ISBN)
More details
Series
Language
English
Place of publication
Didcot
United Kingdom
Target group
College/higher education
Professional and scholarly
Illustrations
illustrations
Dimensions
Height: 300 mm
ISBN-13
978-0-7058-1522-2 (9780705815222)
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Schweitzer Classification