X-ray Microscopy
Published on 19. December 2019
Book
Hardback
587 pages
978-1-107-07657-0 (ISBN)
Description
Written by a pioneer in the field, this text provides a complete introduction to X-ray microscopy, providing all of the technical background required to use, understand and even develop X-ray microscopes. Starting from the basics of X-ray physics and focusing optics, it goes on to cover imaging theory, tomography, chemical and elemental analysis, lensless imaging, computational methods, instrumentation, radiation damage, and cryomicroscopy, and includes a survey of recent scientific applications. Designed as a 'one-stop' text, it provides a unified notation, and shows how computational methods in different areas are linked with one another. Including numerous derivations, and illustrated with dozens of examples throughout, this is an essential text for academics and practitioners across engineering, the physical sciences and the life sciences who use X-ray microscopy to analyze their specimens, as well as those taking courses in X-ray microscopy.
Reviews / Votes
'This magnificent treatise, beautifully printed (in Singapore) by Cambridge University Press, covers the subject methodically in twelve chapters ... The tone is relaxed but rigorous, there is no sacrifice of exactitude to readability, though readability is certainly a priority ...' P.W. Hawkes, Ultramicroscopy 'This text provides an in-depth examination of X-ray microscopy ... Though the title suggests the volume focuses on a narrow topic, the fact that almost half the book covers broader physics and microscopy topics makes it potentially relevant to a much wider audience. Readers with the necessary background can take advantage of the mathematical explanations behind the physics. All readers can enjoy the limericks that conclude each chapter.' T. P. Owen Jr., ChoiceMore details
Series
Language
English
Place of publication
Cambridge
United Kingdom
Target group
Professional and scholarly
Illustrations
74 Halftones, black and white; 199 Line drawings, black and white
Dimensions
Height: 250 mm
Width: 175 mm
Thickness: 36 mm
Weight
1190 gr
ISBN-13
978-1-107-07657-0 (9781107076570)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Person
Chris Jacobsen is an Argonne Distinguished Fellow at Argonne National Laboratory, Illinois, and a Professor of Physics and Astronomy at Northwestern University, Illinois. He is also a Fellow of the American Association for the Advancement of Science, the American Physical Society, and the Optical Society of America.
Content
1. X-ray microscopes: a short introduction; 2. A bit of history; 3. X-ray physics; 4. Imaging Physics; 5. X-ray focusing optics; 6. X-ray microscope systems; 7. X-ray microscope instrumentation; 8. X-ray tomography; 9. X-ray spectromicroscopy; 10. Coherent imaging; 11. Radiation damage and cryo microscopy; 12. Applications, and future prospects.