
Robust Computing with Nano-scale Devices
Progresses and Challenges
Chao Huang(Editor)
Springer (Publisher)
Published on 5. May 2012
Book
Paperback/Softback
VIII, 180 pages
978-94-007-3183-7 (ISBN)
Description
Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.
More details
Series
Edition
2010 ed.
Language
English
Place of publication
Dordrecht
Netherlands
Target group
Professional and scholarly
Research
Illustrations
VIII, 180 p.
Dimensions
Height: 235 mm
Width: 155 mm
Thickness: 11 mm
Weight
295 gr
ISBN-13
978-94-007-3183-7 (9789400731837)
DOI
10.1007/978-90-481-8540-5
Schweitzer Classification
Other editions
Additional editions

Book
03/2010
Springer
€106.99
Shipment within 15-20 days
Content
Fault Tolerant Nanocomputing.- Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics.- Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays.- Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics.- The Prospect and Challenges of CNFET Based Circuits: A Physical Insight.- Computing with Nanowires: A Self Assembled Neuromorphic Architecture.- Computational Opportunities and CAD for Nanotechnologies.