Reliability and Degradation
Semiconductor Devices and Circuits
Published on 25. November 1981
Book
Hardback
456 pages
978-0-471-28028-6 (ISBN)
More details
Series
Language
English
Place of publication
Chichester
United Kingdom
Publishing group
John Wiley and Sons Ltd
Target group
College/higher education
Professional and scholarly
Illustrations
illustrations, index
Dimensions
Height: 240 mm
Width: 160 mm
Weight
750 gr
ISBN-13
978-0-471-28028-6 (9780471280286)
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Schweitzer Classification