Three-Dimensional Imaging, Optical Metrology, and Inspection
V (Proceedings of SPIE)
Published on 1. December 1999
Book
Paperback/Softback
224 pages
978-0-8194-3428-9 (ISBN)
Description
This work presents a series of papers examining various aspects of three-dimensional imaging, optical metrology and inspection.
More details
Language
English
Place of publication
Bellingham
United States
Target group
College/higher education
Professional and scholarly
Illustrations
Illustrations
ISBN-13
978-0-8194-3428-9 (9780819434289)
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Schweitzer Classification