Dimensional Optical Metrology and Inspection for Practical Applications II
Published on 30. November 2013
Book
Paperback/Softback
277 pages
978-0-8194-9689-8 (ISBN)
Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
More details
Series
Language
English
Place of publication
Bellingham
United States
Target group
College/higher education
Professional and scholarly
Illustrations
illustrations
ISBN-13
978-0-8194-9689-8 (9780819496898)
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Schweitzer Classification