
Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes)
World Scientific Publishing Co Pte Ltd
Published on 1. December 2011
Book
Hardback
680 pages
978-981-4322-80-5 (ISBN)
Description
'...These volumes provide the very latest in this critical technology and are an invaluable resource for scientists in both academia and industry concerned with the semiconductor future and all of science.'Foreword by Leonard C Feldman (Director Institute for Advanced Materials, Devices and Nanotechnology, Rutgers University, USA)HighlightsAs we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.
More details
Series
Language
English
Place of publication
Singapore
Singapore
Target group
College/higher education
Advanced graduate students and professionals in physics, chemistry, materials science and nanoscience.
Product notice
Laminated cover
Dimensions
Height: 236 mm
Width: 156 mm
Thickness: 45 mm
Weight
1360 gr
ISBN-13
978-981-4322-80-5 (9789814322805)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Persons
Editor
Ibm Thomas J Watson Research Center, Usa
Ibm Thomas J Watson Research Center, Usa
Ibm Thomas J Watson Research Center, Usa
Content
Atom Probe Tomography; Plasmon Dynamics of Nanostructured Surfaces; Scanning Tunneling Microscopy of Self Assembled III-V Nanostructures; Nanomembranes; Aberration Corrected Scanning Transmission Microscopy and Electron Energy Loss; Rayleigh Scattering from Carbon Nanotubes; Low Energy Electron Microscopy Studies of Nanostructured Semiconductor Surfaces; Scanning Probe Microscopy of GaN Based Structures; Time Domain Thermoreflectance for Thermal Characterization of Nanostructures; X-Ray Studies of Nanostructures; Single Nanowire Photoelectron Spectroscopy; Ultra-High Vacuum Transmission Electron Microscopy; Synthesis and Studies of Low-Dimensional Structures; Raman Spectroscopy of Carbon Nanotubes; Scanning Electron Microscopy for Characterization of Semiconducting Nanowires; X-Ray Diffraction for Stress Determination in Nanostructures.