Surface Scattering and Diffraction for Advanced Metrology
SPIE Press
Published on 28. February 2002
Book
Paperback/Softback
172 pages
978-0-8194-4161-4 (ISBN)
More details
Series
Edition
New ed.
Language
English
Place of publication
Bellingham
United States
Target group
Professional and scholarly
ISBN-13
978-0-8194-4161-4 (9780819441614)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Classification