Progress in Materials Analysis
Vol. 2
Published on 17. December 1985
Book
Paperback/Softback
X, 382 pages
978-3-211-81905-0 (ISBN)
Description
Vol. 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals ............................................. .
More details
Series
Edition
Softcover reprint of the original 1st ed. 1985
Language
English
Place of publication
Vienna
Austria
Publishing group
Springer Wien
Target group
College/higher education
Professional and scholarly
Research
Illustrations
X, 382 p.
Dimensions
Height: 22.9 cm
Width: 15.2 cm
Weight
650 gr
ISBN-13
978-3-211-81905-0 (9783211819050)
DOI
10.1007/978-3-7091-8840-8
Schweitzer Classification
Other editions
Additional editions
E-Book
12/2012
Springer
€53.49
Available for download
Content
Surface Characterization of Thin Organic Films on Metals.- Analysis of Very Thin Organic Fibres by Means of Small Spots Electron Spectroscopy for Chemical Analysis.- Ion Implantation in the Surface Analysis of Solid Materials.- Comparison of Ion Implantation Profiles Obtained by AES/Sputtering Measurements and Monte Carlo Calculations.- Microfocussed Ion Beams for Surface Analysis and Depth Profiling.- Secondary Neutral Mass Spectrometry Depth Profile Analysis of Silicides.- Analysis of Thin Chromate Layers on Aluminium. I. Opportunities and Limitations of Surface Analytical Methods.- Analysis of Thin Chromate Layers on Aluminium. II. Structure and Composition of No-rinse Conversion Layers.- Surface Analytical Investigation of the Corrosion Behaviour of Ti(Pd) Samples.- Determination of the Lubricant Thickness Distribution on Magnetic Disks by Means of X-Ray Induced Volatilization and Simultaneous Photoelectron Spectroscopy.- Internal Quantification of Glow Discharge Optical Spectroscopy-Depth Profiles of Oxide and Nitride Layers on Metals.- Element Profiling by Secondary Ion Mass Spectrometry of Surface Layers in Glasses.- Neutral Primary Beam Secondary Ion Mass Spectrometry Analysis of Corrosion Phenomena on Glass Surfaces.- Quantitative Distribution Analysis of Phosphorus in Silicon with Secondary Ion Mass Spectrometry.- Positron Studies of Defects in Metals and Semiconductor.- Kossel Technique and Positron Annihilation Used to Clarify Sintering Processes.- Selection and Qualification Tests of High Temperature Materials by Special Microanalytical Methods.- On the Application of Acoustic Emission Analysis to Evaluate the Integrity of Protective Coatings t on High-Temperature Alloys.- Microprobe Measurements to Determine the Melt Equilibria of High-Alloy Nickel Materials.- Experimental Determination of the Depth Distribution of X-Ray Production ?(?z) for X-Ray Energies Below 1 keV.- Electron Probe Microanalysis of Oxygen and Determination of Oxide Film Thickness Using Gaussian ?(?z) Curves.- Procedures to Optimize the Measuring Methods in the Electron Probe Microanalysis of Low Energy X-Rays.- Quantitative Microstructural Analysis of Sintered Silicon Nitride by Using a Thin-Window Energy Dispersive X-Ray Detector System.- Optimizing the Microstructure of Implant Alloy TiA15Fe2.5 by Microprobe Analysis.- Characterization of Technical Surfaces With a Coupled SEM-EDA-Image Analyzer System.- Microanalytical Characterization of a Powder Metallurgical Ledeburitic Tool Steel by Transmission Electron Microscopy.- Determination of the Bonding Behaviour of Carbon and Nitrogen in Micro-Alloyed Structural Steels.- Analytical Electron Microscopy of Rare-Earth Permanent Magnet Materials.