Electron Microscopy and Analysis: Conference Proceedings v. 1 & 2
Published in January 1990
Book
Hardback
951 pages
978-0-85498-064-2 (ISBN)
More details
Series
Language
English
Place of publication
United Kingdom
Target group
College/higher education
Professional and scholarly
Illustrations
author index, subject index
Dimensions
Height: 234 mm
Width: 156 mm
ISBN-13
978-0-85498-064-2 (9780854980642)
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Schweitzer Classification