Defect and Fault Tolerance in VLSI Systems: Proceedings
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (24th: 2009: Chicago, Il)
Book
Paperback/Softback
455 pages
978-0-7695-3839-6 (ISBN)
More details
Language
English
Place of publication
United States
Product notice
Paperback (trade)
ISBN-13
978-0-7695-3839-6 (9780769538396)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.