Advances in X-Ray Analysis
Volume 37
1st Edition
Published on 30. September 1994
Book
Hardback
XXI, 756 pages
978-0-306-44901-7 (ISBN)
Description
89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.
More details
Edition
1., 994
Language
English
Place of publication
Dordrecht
Netherlands
Publishing group
Kluwer Academic Publishers Group
Target group
College/higher education
Professional and scholarly
Research
Product notice
Laminated cover
Illustrations
XXI, 756 p.
Dimensions
Height: 260 mm
Width: 183 mm
Thickness: 48 mm
Weight
1644 gr
ISBN-13
978-0-306-44901-7 (9780306449017)
DOI
10.1007/978-1-4615-2528-8
Schweitzer Classification
Other editions
Additional editions
Book
11/2012
Springer
€53.49
Shipment within 7-9 days
Content
89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.