Sequential Logic Testing and Verification
Published on 30. November 1991
Book
Hardback
XIX, 214 pages
978-0-7923-9188-3 (ISBN)
Description
In order to design and build computers that achieve and sustain high performance, it is essential that reliability issues be considered care fully. The problem has several aspects. Certainly, considering reliability implies that an engineer must be able to analyze how design decisions affect the incidence of failure. For instance, in order design reliable inte gritted circuits, it is necessary to analyze how decisions regarding design rules affect the yield, i.e., the percentage of functional chips obtained by the manufacturing process. Of equal importance in producing reliable computers is the detection of failures in its Very Large Scale Integrated (VLSI) circuit components, caused by errors in the design specification, implementation, or manufacturing processes. Design verification involves the checking of the specification of a design for correctness prior to carrying out an implementation. Implementation verification ensures that the manual design or automatic synthesis process is correct, i.e., the mask-level description correctly implements the specification. Manufacture test involves the checking of the complex fabrication process for correctness, i.e., ensuring that there are no manufacturing defects in the integrated circuit. It should be noted that all the above verification mechanisms deal not only with verifying the functionality of the integrated circuit but also its performance.
More details
Series
Edition
1992 ed.
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Research
Product notice
sewn/stitched
Cloth over boards
Illustrations
XIX, 214 p.
Dimensions
Height: 241 mm
Width: 160 mm
Thickness: 18 mm
Weight
527 gr
ISBN-13
978-0-7923-9188-3 (9780792391883)
DOI
10.1007/978-1-4615-3646-8
Schweitzer Classification
Other editions
Additional editions
Abhijit Ghosh | Srinivas Devadas | A. Richard Newton
Sequential Logic Testing and Verification
E-Book
12/2012
Springer
€149.79
Available for download
Abhijit Ghosh | Srinivas Devadas | A. Richard Newton
Sequential Logic Testing and Verification
Book
10/2012
Springer
€160.49
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Content
List of Figures.- List of Tables.- Preface.- Acknowledgements.- 1 Introduction.- 1.1 IC Design Systems.- 1.2 Implementation Verification.- 1.3 Testing.- 1.4 Synthesis For Testability.- 1.5 Outline.- 2 Sequential Test Generation.- 2.1 Preliminaries.- 2.2 Methods for Sequential Test Generation.- 2.3 Test Generation Strategy.- 2.4 Cover Extraction and Combinational ATG.- 2.5 Justification.- 2.6 Initialization of Circuits.- 2.7 State Differentiation.- 2.8 Identification of Redundant Faults.- 2.9 Test Generation Results Using STEED.- 2.10 Conclusions.- 3 Test Generation Using RTL Descriptions.- 3.1 Preliminaries.- 3.2 Previous Work.- 3.3 Global Strategy for Test Generation.- 3.4 State Justification.- 3.5 Indexed Backtracking.- 3.6 Conflict Resolution.- 3.6.1 Assembling the equations.- 3.7 State Differentiation.- 3.8 Test Generation Results Using ELEKTRA.- 3.9 Conclusions.- 4 Sequential Synthesis for Testability.- 4.1 Preliminaries.- 4.2 Previous Work.- 4.3 Theoretical Results.- 4.4 The Synthesis and Test Strategy.- 4.5 Detection of Invalid States.- 4.6 Detection of Equivalent States.- 4.7 Experimental Results.- 4.8 Conclusions.- 5 Verification of Sequential Circuits.- 5.1 Preliminaries.- 5.2 Previous Work.- 5.3 Implicit STG Traversal.- 5.4 Implicit STG Enumeration.- 5.5 Experimental Results.- 5.6 Conclusions.- 6 Symbolic FSM Traversal Methods.- 6.1 Preliminaries.- 6.2 Traversal by Recursive Range Computation.- 6.3 Traversal based on Transition Relations.- 6.4 Depth-First Geometric Chaining.- 6.5 A Mixed Traversal Algorithm.- 6.6 Implementation of Algorithm.- 6.7 Experimental Results.- 6.8 Conclusions.- 7 Conclusions.- 7.1 Test Generation.- 7.2 Synthesis for Testability.- 7.3 Verification.- 7.4 Directions for Future Work.