
Electrically Based Microstructural Characterization II: Volume 500
Materials Research Society (Publisher)
Published on 9. November 1998
Book
Hardback
384 pages
978-1-55899-405-8 (ISBN)
Description
This book provides a forum for researchers who have been using a variety of electrical measurements as a means to obtain microstructural information about their materials. Microstructure in this context includes features at all length scales - atomic to macroscopic. Even though numerous examples of microstructure/electrical property correlations exist, this book focuses on the myriad of applications that have already been successful. In addition, advances in techniques for the interpretation of data and modelling of materials-related phenomena are emphasized. The effects of percolation and connectivity of electrical paths are of particular interest as they determine the resultant electrical response. These in turn are intimately linked to how a material is processed, what phases it contains, and how the phases are distributed in real space. All classes of materials are covered including semiconductors, electroceramics, biological materials, polymers, metals, geomaterials and a variety of composites. Topics include: advances in localized electrical testing; semiconductor and microelectronic applications; magnetic and polymeric materials; dielectrics and ferroelectrics; varistors; ionic and mixed conductors and composites and percolation systems.
More details
Series
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Illustrations
Worked examples or Exercises
Dimensions
Height: 235 mm
Width: 157 mm
Thickness: 25 mm
Weight
706 gr
ISBN-13
978-1-55899-405-8 (9781558994058)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions

Rosario A. Gerhardt | Mohammed A. Alim | S. Ray Taylor
Electrically Based Microstructural Characterization II: Volume 500
Volume 500
Book
06/2014
Cambridge University Press
€28.51
Article exhausted; check different version
Persons
Editor
Georgia Institute of Technology
Alabama Agricultural and Mechanical University
University of Virginia
Content
Part I. Advances in Localized Electrical Testing; Part II. Semiconductor and Microelectronic Applications; Part III. Magnetic and Polymeric Materials; Part IV. Dielectrics and Ferroelectrics; Part V. Varistors; Part VI. Ionic and Mixed Conductors; Part VII. Composites and Percolation Systems; Author index; Subject index.