From Instrumentation to Nanotechnology
1st Edition
Will be published approx. on 30. January 1992
Book
Hardback
348 pages
978-2-88124-794-1 (ISBN)
Description
Addressed to physical and chemical scientists and engineers, this book provides information on the design, manufacture, and assessment of components with critical dimensions or critical tolerances in the 0.1-100 nanometer range. Such tiny parts are now used in automobile engines, cassette players, and other common products. The 16 lectures presented are from an advanced vacation school on instrumentation and nanotechnology in Warwick, England, September 1990. Among the topics are signal processing, ultrasonic sensors, and nanoactuators for controlled displacements.
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More details
Language
English
Place of publication
Boca Raton
Netherlands
Target group
College/higher education
Professional and scholarly
Academic, Postgraduate, and Professional
Dimensions
Height: 246 mm
Width: 174 mm
Weight
936 gr
ISBN-13
978-2-88124-794-1 (9782881247941)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
J.W. Gardner
From Instrumentation to Nanotechnology
E-Book
11/2024
1st Edition
CRC Press
€73.99
Available for download
J.W. Gardner
From Instrumentation to Nanotechnology
E-Book
11/2024
1st Edition
CRC Press
€73.99
Available for download
Person
J.W. Gardner
Content
Introduction to the Series, Preface, List of Contributors, 1. Trends in Instrumentation and Nanotechnology 2. Signal Processing, 3. Correlation Methods Applied to Instrumentation, 4. Mathematical Modelling of Instruments - Application and Design, 5. Algorithms for Computer Aided Precision Metrology, 6. Ultrasonic Sensors, 7. Recent Advances in Solid-State Microsensors, 8. Nanotechnology, 9. Use of Energy Beams for Ultra-high Precision Processing of Materials, 10. Control of High Precision Instruments and Machines, 11. Optical Metrology: The Precision Measurement of Displacement Using Optical Interferometry, 12. Optical Diffraction for Surface Roughness Measurement, 13. Nanoparticle Visualization for Particle Image Velocimetry at Transionic Speeds, 14. High Precision Surface Profilometry: From Stylus to STM, 15. Nanoactuators for Controlled Displacements, 16. Calibration of Linear Transducers by X-ray Interferometry, Index