
Automating Software Defect Detection Through Machine Learning and LLMs
IGI Global (Publisher)
Published on 2. October 2025
Book
Hardback
550 pages
979-8-3373-4460-7 (ISBN)
Description
As software systems grow in complexity and scale, ensuring their reliability and quality becomes challenging. Traditional methods of defect detection are time-consuming, prone to errors, and inadequate for identifying issues. To address these limitations, the integration of machine learning (ML) techniques and large language models (LLMs) emerges as a transformative approach in automating software defect detection. ML algorithms can learn from historical bug data to predict vulnerabilities, while LLMs can detect anomalies with high accuracy. This convergence holds the potential to improve automation, software engineering, and defect detection, while introducing new challenges in interpretability, data bias, and model reliability that require further exploration. Automating Software Defect Detection Through Machine Learning and LLMs explores how cutting-edge technologies like machine learning (ML) and large language models (LLMs) transform software detection. It examines how these technologies enhance accuracy, scalability, and efficiency in identifying and mitigating software defects. This book covers topics such as algorithms, fraud detection, and software engineering, and is a useful resource for engineers, security professionals, academicians, researchers, and computer scientists.
More details
Language
English
Target group
College/higher education
Professional and scholarly
Product notice
sewn/stitched
Cloth over boards
Dimensions
Height: 260 mm
Width: 183 mm
Thickness: 27 mm
Weight
995 gr
ISBN-13
979-8-3373-4460-7 (9798337344607)
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Schweitzer Classification
Other editions
Additional editions

Bryan Gardiner | Pancham Singh | Prashant Upadhyay
Automating Software Defect Detection Through Machine Learning and LLMs
Book
10/2025
Engineering Science Reference
€242.80
Shipment within 10-20 days