Transmission Electron Microscopy and Diffractometry of Materials
4th Edition
Published on 14. October 2012
Book
Hardback
XX, 764 pages
978-3-642-29760-1 (ISBN)
Description
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Reviews / Votes
``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.''John Hutchison in Journal of Microscopy
``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.''
Ray Egerton in Micron
``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.''
John C. H. Spence, Arizona State University
``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.''
Colin Humphreys, Cambridge University
``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.''
Ronald Gronsky, University of California, Berkeley
``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.''
John Hutchison in Journal of Microscopy
``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.''
Ray Egerton in Micron
``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.''
John C. H. Spence, Arizona State University
``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.''
Colin Humphreys, Cambridge University
``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.''
Ronald Gronsky, University of California, Berkeley
More details
Product info
Book
Series
Edition
4th ed. 2013
Language
English
Place of publication
Heidelberg
Germany
Publishing group
Springer Berlin
Target group
Professional and scholarly
Graduate
Edition type
Revised edition
Illustrations
XX, 764 p.
Dimensions
Height: 241 mm
Width: 160 mm
Thickness: 47 mm
Weight
1326 gr
ISBN-13
978-3-642-29760-1 (9783642297601)
DOI
10.1007/978-3-642-29761-8
Schweitzer Classification
Other editions
Additional editions
Brent Fultz | James Howe
Transmission Electron Microscopy and Diffractometry of Materials
Book
11/2014
4th Edition
Springer
€90.94
Shipment within 7-9 days
Brent Fultz | James Howe
Transmission Electron Microscopy and Diffractometry of Materials
E-Book
10/2012
4th Edition
Springer
€90.94
Available for download
Previous edition
Brent Fultz | James Howe
Transmission Electron Microscopy and Diffractometry of Materials
Book
10/2009
3rd Edition
Springer
€96.25
Article exhausted; check for reprint
Persons
Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on Transmission Electron Microscopy and Diffractometry of Materials.
James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.
Content
Diffraction and X-Ray Powder Diffractometer Problems.- TEM and its Optics Problems.- Neutron Scattering Problems.- Scattering Problems.- Inelastic Electron Scattering and Spectroscopy Problems.- Diffraction from Crystals Sphere Problems.- Electron Diffraction and Crystallography Problems.- Diffraction Contrast in TEM Images Problems.- Diffraction Lineshapes Problems.- Patterson Functions and Diffuse Scattering Problems.- High-Resolution TEM Imaging Problems.- High-Resolution STEM and Related Imaging Techniques Problems.- Dynamical Theory Problems.