
Transmission Electron Microscopy and Diffractometry of Materials
Springer (Publisher)
2nd Edition
Published on 19. January 2005
Book
Hardback
XXI, 748 pages
978-3-540-43764-2 (ISBN)
Article exhausted; check for reprint
Description
This practical and theoretical text/reference develops the concepts of transmission electron microscopy and x-ray diffractometry. This acclaimed new edition contains many improved explanations and new material on high-resolution microscopy.
Reviews / Votes
"I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques."(John Hutchison in Journal of Microscopy)"I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization."(Ray Egerton in Micron)"A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience."(John C. H. Spence, Arizona State University)"I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending this book for my course. It is a superb book."(Colin Humphries, Cambridge University)"This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended."(Ronald Gronsky, University of California, Berkeley)From the reviews of the second edition:
"Transmission Electron Microscopy and Diffractometry of Materials has only been out since 2001 . but so well has it sold that B. Fultz and J. Howe have already produced a revised edition, the revisions 'ranging from substantial re-structuring to subtle rewording'. . I must insist that this text represents an enormous amount of work, it is densely filled, well-illustrated and carefully organized. It should be on a shelf in all electron microscopy laboratories . ." (Ultramicroscopy, Vol. 99, 2004)
"The book by Fultz and Howe, now in its second edition, is part of a programme of advanced texts covering topics of current and emerging interest in physics. . Each chapter is accompanied by several problems suitable for a written examination. The contents are very comprehensive . . My impression is that the book will serve as a useful reference work, as well as a core textbook for graduate students." (Professor L. M. Brown, Contemporary Physics, Vol. 44 (6), 2003)
"The main objective of the present book is teaching. . Each chapter concludes with a number of problems to be solved by students. Furthermore the appendix contains valuable information in the form of tables and graphs, and also practical hints for daily laboratory work, which might be useful for accreditation procedures. The book can be highly recommended . ." (W. Oesterle, Werkstoffe und Korrosion, Issue 9, 2003)
More details
Edition
2nd ed. 2002. Corr. 2nd printing
Language
English
Place of publication
Heidelberg
Germany
Publishing group
Springer Berlin
Target group
College/higher education
Professional and scholarly
Edition type
Revised edition
Illustrations
423 illus., numerous exercises.
Dimensions
Height: 23.5 cm
Width: 15.5 cm
Weight
1256 gr
ISBN-13
978-3-540-43764-2 (9783540437642)
DOI
10.1007/978-3-662-04901-3
Schweitzer Classification
Other editions
New editions

Brent Fultz | James Howe
Transmission Electron Microscopy and Diffractometry of Materials
Book
10/2009
3rd Edition
Springer
€96.25
Article exhausted; check for reprint
Additional editions

Brent Fultz | James Howe
Transmission Electron Microscopy and Diffractometry of Materials
E-Book
06/2013
2nd Edition
Springer
€85.59
Available for download
Previous edition

Brent Fultz | James M. Howe
Transmission Electron Microscopy and Diffractometry of Materials
Book
01/2001
Springer
€85.59
Article exhausted; check for reprint
Content
Contens.- 1 Diffraction and the X-Ray Powder Diffractometer.- 2 The TEM and its Optics.- 3 Scattering.- 4 Inelastic Electron Scattering and Spectroscopy.- 5 Diffraction from Crystals.- 6 Electron Diffraction and Crystallography.- 7 Diffraction Contrast in TEM Images.- 8 Diffraction Lineshapes.- 9 Patterson Functions and Diffuse Scattering.- 10 High-Resolution TEM Imaging.- 11 Dynamical Theory.- Further Reading.- References and Figures.- A Appendix.- A.1 Indexed Powder Diffraction Patterns.- A.3 Atomic Form Factors for X-Rays.- A.4 X-Ray Dispersion Corrections for Anomalous Scattering.- A.5 Atomic Form Factors for 200 keV Electrons and Procedure for Conversion to Other Voltages.- A.6 Indexed Single Crystal Diffraction Patterns: fcc, bcc, dc, hcp.- A.7 Stereographic Projections.- A.8 Examples of Fourier Transforms.- A.10 Numerical Approximation for the Voigt Function.- A.11 Debye-Waller Factor from Wave Amplitude.- A.12 Review of Dislocations.- A.13 TEM Laboratory Exercises.- A.13.1 Preliminary - JEOL 2000FX Daily Operation..- A.13.2 Preliminary - Philips 400T Daily Operation.- A.13.6 Laboratory 4 - Contrast Analysis of Defects.- A.14 Fundamental and Derived Constants.