Post-Silicon Verification and Debugging for C-Based Designs 2016
Masahiro Fujita(Editor)
Springer (Publisher)
Published on 4. January 2016
Book
Hardback
300 pages
978-1-4614-0931-1 (ISBN)
Description
This book describes techniques for how to verify and debug VLSI designs when bugs are found after the chips are fabricated and used in the field. This is the first book to cover many aspects of post-silicon verification and debugging techniques that utilize high-level design information, such as design descriptions in C/C++. Using high-level analysis on the error traces generated by fabricated chips maximizes the efficiency of the verification and debugging techniques presented in this book. Experimental results are included for real applications of the techniques presented.
More details
Edition
2015 ed.
Language
English
Place of publication
New York, NY
United States
Target group
Professional and scholarly
Research
Illustrations
100 s/w Abbildungen
100 black & white illustrations, biography
Dimensions
Height: 235 mm
Width: 155 mm
ISBN-13
978-1-4614-0931-1 (9781461409311)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Classification
Content
Hardware diagnosis, debug and correction for RTL/gate level designs.- Tracing techniques for design descriptions.- Extraction of high level stimulus from chip error trace.- Diagnosis based on transactions.- Hardware support for diagnosis.- Diagnosis for C-based designs.- Test pattern generation for C-based designs.- Patching (patchable) hardware.