Advances In Multiphysics Simulation And Experimental Testing Of Mems
Will be published approx. on 31. July 2008
Book
Hardback
504 pages
978-1-86094-862-6 (ISBN)
Description
This volume takes a much needed multiphysical approach to the numerical and experimental evaluation of the mechanical properties of MEMS and NEMS. The contributed chapters present many of the most recent developments in fields ranging from microfluids and damping to structural analysis, topology optimization and nanoscale simulations. The book responds to a growing need emerging in academia and industry to merge different areas of expertise towards a unified design and analysis of MEMS and NEMS.
More details
Series
Language
English
Place of publication
London
United Kingdom
Target group
College/higher education
Product notice
sewn/stitched
Cloth over boards
Dimensions
Height: 231 mm
Width: 155 mm
Thickness: 33 mm
Weight
862 gr
ISBN-13
978-1-86094-862-6 (9781860948626)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Persons
Content
Challenges in Modeling Liquid and Gas Flows in Micro/Nanodevices (M Gad-El-Hak); Using the Kinetic Equations for MEMS and NEMS (C Cercignani et al.); Applying the Direct Simulation Monte Carlo (DSMC) Method to Gas-Filled MEMS Devices (M Gallis); New Approaches for the Simulation of Microfluidics in MEMS (H Li); Evaluating Gas Damping in MEMS Using Fast Integral Equation Solvers (J White et al.); Experimental Techniques for Damping Characterization of Micro and Nanostructures (A Bosseboeuf & H Mathias); Nonlinear Dynamics of Electrostatically Actuated MEMS (N Aluru & S K De); Coupled Deformation Analysis of Thin MEMS Plates (S Mukherjee & S Telukunta); Pull-In Instability in Electrostatically Actuated MEMS (R Batra & D Spinello); Numerical Simulation of BIOMEMS with Dielectrophoresis (G R Liu & C X Song); Continuous Modeling of Multiphysics Problems of Microsystems for Topology Optimization (G K Ananthasuresh); Mechanical Characterization of Polysilicon at the Microscale Through On-Chip Tests (A Corigliano et al.); Nanoscale Testing of Nanowires and Carbon Nanotubes Using a Microelectromechanical System (H Espinosa et al.).