Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment

Technology and Economics.- High Temperature Electronics - Cluster Effects.- On the Evolution of SOI Materials and Devices.- SOI Technology as a Basis for Microphotonic-Microelectronic Integrated Devices.- SOI Material Technologies.- Smart Cut Technology: The Path for Advanced SOI Substrates.- Porous Silicon Based SOI: History and Prospects.- Achievement of SiGe-on-Insulator Technology.- CVD Diamond Films for SOI Technologies.- Radical Beam Quasiepitaxy Technology for Fabrication of Wide-Gap Semiconductors on Insulator.- Impact of Hydrostatic Pressure during Annealing of Si:O on Creation of Simox - Like Structures.- SiO2 and Si3N4 Phase Formation by Ion Implantation with In-Situ Ultrasound Treatment.- Fabrication and Characterisation of Silicon on Insulator Substrates Incorporating Thermal Vias.- Reliability and Operation of SOI Devices in Harsh Environment.- Reliability and Electrical Fluctuations in Advanced SOI CMOS Devices.- Hydrogen and High-Temperature Charge Instability of SOI Structures and MOSFETs.- Recent Advances in SOI MOSFET Devices and Circuits for Ultra-Low Power / High Temperature Applications.- Silicon-on-Insulator Circuits for Application at High Temperatures.- High-Voltage SOI Devices for Automotive Applications.- Heat Generation Analysis in SOI LDMOS Power Transistors.- Novel SOI MOSFET Structure for Operation over a Wide Range of Temperatures.- MOSFETs Scaling Down: Advantages and Disadvantages for High Temperature Applications.- Temperature Dependence of RF Losses in High-Resistivity SOI Substrates.- Radiation Effects.- Review of Radiation Effects in Single and Multiple-Gate SOI MOSFETs.- Radiation Effects in SOI: Irradiation by High Energy Ions and Electrons.- Radiation Characteristics of Short P- Channel MOSFETs on SOI Substrates.- Total Dose Behavior of Partially Depleted Delecut SOI MOSFETs.- Radiation Effect on Electrical Properties of Fully-Depleted Unibond SOI MOSFETs.- Characterization and Simulation of SOI Devices Operating under Harsh Environment.- Low Cost High Temperature Test System for SOI Devices.- Characterization of Carrier Generation in Thin-Film SOI Devices by Reverse Gated-Diode Technique and its Application at High Temperatures.- Back-Gate Induced Noise Overshoot in Partially-Depleted SOI MOSFETs.- Novel SOI Devices and Sensors Operating at Harsh Conditions.- SiGe Heterojunction Bipolar Transistors on Insulating Substrates.- Silicon-on-Insulator Substrates with Buried Ground Planes (GPSOI).- High-Voltage High-Current DMOS Transistor Compatible with High-Temperature Thin-Film SOI CMOS Applications.- A Novel Low Leakage EEPROM Cell for Application in an Extended Temperature Range (?40°C Up to 225°C).- Design, Fabrication and Characterization of SOI Pixel Detectors of Ionizing Radiation.- Polysilicon-on-Insulator Layers at Cryogenic Temperatures and High Magnetic Fields.- Planar Photomagnetic Effect SOI Sensors for Various Applications with Low Detection Limit.- Theoretical Limit for the SiO2 Thickness in Silicon MOS Devices.- Compact Model of the Nanoscale Gate-All-Around MOSFET.- Self-Assembled Semiconductor Nanowires on Silicon and Insulating Substrates: Experimental Behavior.- Fabrication of SOI Nano Devices.