Advances in Pattern Recognition
Joint IAPR International Workshops SSPR 2000 and SPR 2000 Alicante, Spain, August 30 - September 1, 2000 Proceedings
Published on 23. August 2000
Book
Paperback/Softback
XXXVI, 904 pages
978-3-540-67946-2 (ISBN)
Description
This book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52 revised full papers presented together with five invited papers and 35 posters were carefully reviewed and selected from a total of 130 submissions. The book offers topical sections on hybrid and combined methods, document image analysis, grammar and language methods, structural matching, graph-based methods, shape analysis, clustering and density estimation, object recognition, general methodology, and feature extraction and selection.
More details
Series
Edition
2000 ed.
Language
English
Place of publication
Berlin
Germany
Publishing group
Springer Berlin
Target group
Professional and scholarly
Research
Illustrations
XXXVI, 904 p.
Dimensions
Height: 235 mm
Width: 155 mm
Thickness: 43 mm
Weight
1177 gr
ISBN-13
978-3-540-67946-2 (9783540679462)
DOI
10.1007/3-540-44522-6
Schweitzer Classification
Other editions
Additional editions
Francesc J. Ferri | Jose M. Inesta | Adnan Amin
Advances in Pattern Recognition
Joint IAPR International Workshops SSPR 2000 and SPR 2000 Alicante, Spain, August 30 - September 1, 2000 Proceedings
E-Book
06/2003
Springer
€96.29
Available for download
Content
Invited Papers.- Pierre Devijver Lecture.- Hybrid and Combined Methods.- Applications.- Document Image Analysis.- Grammar and Language Methods.- Structural Matching.- Graph-Based Methods.- Shape Analysis.- SSPR Poster Session.- Clustering and Density Estimation.- Object Recognition.- General Methodology I.- General Methodology II.- Feature Extraction and Selection.- SPR Poster Session.