
Impurity Diffusion and Gettering in Silicon: Volume 36
Materials Research Society (Publisher)
Published on 15. May 1985
Book
Hardback
300 pages
978-0-931837-01-2 (ISBN)
Article exhausted; check for reprint
Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
More details
Series
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Illustrations
Worked examples or Exercises
Dimensions
Height: 229 mm
Width: 152 mm
Thickness: 17 mm
Weight
570 gr
ISBN-13
978-0-931837-01-2 (9780931837012)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
New editions

Richard B. Fair | Charles W. Pearce | Jack Washburn
Impurity Diffusion and Gettering in Silicon: Volume 36
Volume 36
Book
06/2014
Cambridge University Press
€41.60
Shipment within 15-20 days
Additional editions

Richard B. Fair | Charles W. Pearce | Jack Washburn
Impurity Diffusion and Gettering in Silicon: Volume 36
Volume 36
Book
06/2014
Cambridge University Press
€41.60
Shipment within 15-20 days