Characterization of Optical Materials
Gregory J. Exarhos(Author)
Butterworth-Heinemann (Publisher)
Published in May 1993
Book
Hardback
250 pages
978-0-7506-9298-4 (ISBN)
Description
Covering how surface morphology, microstructure and chemical bonding influence the optical response of a material, this book shows methods used to characterize thin films, multilayer structures and modified surfaces. Included are summaries of characterization methods specific to optical materials.
Covering how surface morphology, microstructure and chemical bonding influence the optical response of a material, this book shows methods used to characterize thin films, multilayer structures and modified surfaces. Included are summaries of characterization methods specific to optical materials.
Covering how surface morphology, microstructure and chemical bonding influence the optical response of a material, this book shows methods used to characterize thin films, multilayer structures and modified surfaces. Included are summaries of characterization methods specific to optical materials.
More details
Series
Language
English
Place of publication
Oxford
United Kingdom
Publishing group
Elsevier Science & Technology
Target group
Professional and scholarly
Dimensions
Height: 152 mm
Width: 229 mm
Weight
497 gr
ISBN-13
978-0-7506-9298-4 (9780750692984)
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Schweitzer Classification
Content
Part 1 Influence of surface morphology and microstructure on the optical response: characterization of surface roughness; characterization of the near-surface region using polarization-sensitive optical techniques; role of stoichiometry and crystalline phase on the optical resonse; diamond as an optical material. Part 2 Stability and modification of film and surface optical properties: multilayer optical coatings; interfacial stress and optical properties of films; suface modification of optical materials; laser-induced damage to optical materials.