Atomic Force Microscopy
Published on 25. March 2010
Book
Hardback
256 pages
978-0-19-957045-4 (ISBN)
Description
Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.
Reviews / Votes
Atomic Force Microscopy is a great introduction to AFMs for beginners and, although light on theory, also serves as a good starting point for more serious users. * Udo D. Schwarz, Physics Today * There is definitely room for a general book on AFM which concentrates on how to get the most from the instrument and teaches the beginner/moderately experienced user the 'tricks of the trade'. * Jamie Hobbs, Sheffield University, UK * Atomic Force Microscopy is the manual that should accompany any Atomic Force Microscope. * Othmar Marti, University of Ulm, Germany * I recommend this book to any reader who wants to enter the world of force microscopy. This book is easy to read, entertaining, with a practical approach. * Carmen Serra, Nanotechnology and Surface Analysis Service, University of Vigo, Spain *More details
Language
English
Place of publication
Oxford
United Kingdom
Target group
College/higher education
Professional and scholarly
Industrial users of Atomic Force Microscopy. University researchers using AFM (students in undergraduate and postgraduate degrees, and post doctoral researchers and professors). Both teachers and students in courses involving AFM, especially nanotechnology courses.
Illustrations
150 b/w line and halftone illustrations, 9 colour figures
Dimensions
Height: 256 mm
Width: 174 mm
Thickness: 18 mm
Weight
660 gr
ISBN-13
978-0-19-957045-4 (9780199570454)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Persons
Peter Eaton has more than ten years' experience in research using Atomic Force Microscopy. He has used a wide variety of AFM instruments in research centres and universities in the UK, France, Spain, and Portugal. He has used AFM to study pharmaceutical, chemical, materials science, nanotech and biological samples. He is the author of more than twenty research publications on AFM.
Paul West has over twenty-five years' experience with the development of atomic force microscopes. He is the co-founder of several AFM companies, the author of numerous patents, and co-author of several publications on the design and application of atomic force microscopes. He served on the United States National Nanotechnology Initiative which resulted in the first major funding of nanotechnology research.
Paul West has over twenty-five years' experience with the development of atomic force microscopes. He is the co-founder of several AFM companies, the author of numerous patents, and co-author of several publications on the design and application of atomic force microscopes. He served on the United States National Nanotechnology Initiative which resulted in the first major funding of nanotechnology research.
Content
1. Introduction ; 2. Instrumental Aspects of AFM ; 3. AFM Modes ; 4. Measuring AFM Images ; 5. Image Processing in AFM ; 6. Image Artifacts in AFM ; 7. Applications of AFM ; Appendix 1: AFM Standards and Calibration Specimens ; Appendix 2: AFM Software