Measurement and Data Analysis for Engineering and Science, Third Edition
3rd Edition
Published on 27. June 2014
Book
Hardback
632 pages
978-1-4665-9496-8 (ISBN)
Description
The third edition of Measurement and Data Analysis for Engineering and Science provides an up-to-date approach to presenting the methods of experimentation in science and engineering. Widely adopted by colleges and universities within the U.S. and abroad, this edition has been developed as a modular work to make it more adaptable to different approaches from various schools.
This text details current methods and highlights the six fundamental tools required for implementation: planning an experiment, identifying measurement system components, assessing measurement system component performance, setting signal sampling conditions, analyzing experimental results, and reporting experimental results.
What's New in the Third Edition:
This latest edition includes a new chapter order that presents a logical sequence of topics in experimentation, from the planning of an experiment to the reporting of the experimental results. It adds a new chapter on sensors and transducers that describes approximately 50 different sensors commonly used in engineering, presents uncertainty analysis in two separate chapters, and provides a problem topic summary in each chapter.
New topics include smart measurement systems, focusing on the Arduino (R) microcontroller and its use in the wireless transmission of data, and MATLAB (R) and Simulink (R) programming for microcontrollers. Further topic additions are on the rejection of data outliers, light radiation, calibrations of sensors, comparison of first-order sensor responses, the voltage divider, determining an appropriate sample period, and planning a successful experiment.
Measurement and Data Analysis for Engineering and Science also contains more than 100 solved example problems, over 400 homework problems, and provides over 75 MATLAB (R) Sidebars with accompanying MATLAB M-files, Arduino codes, and data files available for download.
This text details current methods and highlights the six fundamental tools required for implementation: planning an experiment, identifying measurement system components, assessing measurement system component performance, setting signal sampling conditions, analyzing experimental results, and reporting experimental results.
What's New in the Third Edition:
This latest edition includes a new chapter order that presents a logical sequence of topics in experimentation, from the planning of an experiment to the reporting of the experimental results. It adds a new chapter on sensors and transducers that describes approximately 50 different sensors commonly used in engineering, presents uncertainty analysis in two separate chapters, and provides a problem topic summary in each chapter.
New topics include smart measurement systems, focusing on the Arduino (R) microcontroller and its use in the wireless transmission of data, and MATLAB (R) and Simulink (R) programming for microcontrollers. Further topic additions are on the rejection of data outliers, light radiation, calibrations of sensors, comparison of first-order sensor responses, the voltage divider, determining an appropriate sample period, and planning a successful experiment.
Measurement and Data Analysis for Engineering and Science also contains more than 100 solved example problems, over 400 homework problems, and provides over 75 MATLAB (R) Sidebars with accompanying MATLAB M-files, Arduino codes, and data files available for download.
More details
Edition
3rd New edition
Language
English
Place of publication
Bosa Roca
United States
Publishing group
Taylor & Francis Inc
Target group
College/higher education
Mechanical and aerospace engineering students, engineers and researchers wanting a readable, up-to-date survey of measurement techniques.
Edition type
New edition
Product notice
sewn/stitched
Cloth over boards
Illustrations
217 s/w Abbildungen, 66 s/w Tabellen
Endsheets print 1 color - Tables to be printied on ifc, ibc (4pp); 66 Tables, black and white; 217 Illustrations, black and white
Dimensions
Height: 240 mm
Width: 163 mm
Thickness: 40 mm
Weight
1023 gr
ISBN-13
978-1-4665-9496-8 (9781466594968)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Previous edition
Book
01/2010
2nd Edition
CRC Press
€87.89
Article exhausted; check for reprint
Person
Patrick F. Dunn, Ph.D., P.E., is a professor of aerospace and mechanical engineering at the University of Notre Dame. He earned his B.S., M.S., and Ph.D. degrees in engineering from Purdue University (1970, 1971, and 1974). Professor Dunn is the author of over 160 scientific journal and refereed symposia publications, and various textbooks including Measurement and Data Analysis for Engineering and Science Second Edition by Taylor & Francis / CRC Press, 2010; Measurement and Data Analysis for Engineering and Science, Third Edition by Taylor & Francis / CRC Press; and Fundamentals of Sensors for Engineering and Science First Edition by Taylor & Francis / CRC Press, 2011.
Content
<P><STRONG>Fundamentals of Experimentation</STRONG></P>
<P>Introduction</P><STRONG>
<P>Experiments</P></STRONG>
<P>Chapter Overview</P>
<P>Experimental Approach</P>
<P>Role of Experiments</P>
<P>The Experiment</P>
<P>Classification of Experiments</P>
<P>Plan for Successful Experimentation</P>
<P>Hypothesis Testing*</P>
<P>Design of Experiments*</P>
<P>Factorial Design*</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Fundamental Electronics</P></STRONG>
<P>Chapter Overview</P>
<P>Concepts and Definitions</P>
<P>Circuit Elements</P>
<P>RLC Combinations</P>
<P>Elementary DC Circuit Analysis</P>
<P>Elementary AC Circuit Analysis</P>
<P>Equivalent Circuits*</P>
<P>Meters*</P>
<P>Impedance Matching and Loading Error*</P>
<P>Electrical Noise*</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Measurement Systems: Sensors and Transducers</P></STRONG>
<P>Chapter Overview</P>
<P>Measurement System Overview</P>
<P>Sensor Domains</P>
<P>Sensor Characteristics</P>
<P>Physical Principles of Sensors</P>
<P>Electric</P>
<P>Piezoelectric</P>
<P>Fluid Mechanic</P>
<P>Optic</P>
<P>Photoelastic</P>
<P>Thermoelectric</P>
<P>Electrochemical</P>
<P>Sensor Scaling*</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Measurement Systems: Other Components</P></STRONG>
<P>Chapter Overview</P>
<P>Signal Conditioning, Processing, and Recording</P>
<P>Amplifiers</P>
<P>Filters</P>
<P>Analog-to-Digital Converters</P>
<P>Smart Measurement Systems</P>
<P>Other Example Measurement Systems</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Measurement Systems: Calibration and Response</P></STRONG>
<P>Chapter Overview</P>
<P>Static Response Characterization by Calibration</P>
<P>Dynamic Response Characterization</P>
<P>Zero-Order System Dynamic Response</P>
<P>First-Order System Dynamic Response</P>
<P>Second-Order System Dynamic Response</P>
<P>Measurement System Dynamic Response</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Measurement Systems: Design-Stage Uncertainty</P></STRONG>
<P>Chapter Overview</P>
<P>Design-Stage Uncertainty Analysis</P>
<P>Design-Stage Uncertainty Estimate of a Measurand</P>
<P>Design-Stage Uncertainty Estimate of a Result</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Signal Characteristics</P></STRONG>
<P>Chapter Overview</P>
<P>Signal Classification</P>
<P>Signal Variables</P>
<P>Signal Statistical Parameters</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>The Fourier Transform</P></STRONG>
<P>Chapter Overview</P>
<P>Fourier Series of a Periodic Signal</P>
<P>Complex Numbers and Waves</P>
<P>Exponential Fourier Series</P>
<P>Spectral Representations</P>
<P>Continuous Fourier Transform</P>
<P>Continuous Fourier Transform Properties*</P>
<P>Discrete Fourier Transform</P>
<P>Fast Fourier Transform</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Digital Signal Analysis</P></STRONG>
<P>Chapter Overview</P>
<P>Digital Sampling</P>
<P>Digital Sampling Errors</P>
<P>Windowing*</P>
<P>Determining a Sample Period</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Probability</P></STRONG>
<P>Chapter Overview</P>
<P>Relation to Measurements</P>
<P>Basic Probability Concepts</P>
<P>Sample versus Population</P>
<P>Plotting Statistical Information</P>
<P>Probability Density Function</P>
<P>Various Probability Density Functions</P>
<P>Central Moments</P>
<P>Probability Distribution Function</P>
<P>Problems</P>
<P>Bibliography</P>
<P>Statistics</P>
<P>Chapter Overview</P>
<P>Normal Distribution</P>
<P>Normalized Variables</P>
<P>Student's t Distribution</P>
<P>Rejection of Data</P>
<P>Standard Deviation of the Means</P>
<P>Chi-Square Distribution</P>
<P>Pooling Samples*</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Uncertainty Analysis</P></STRONG>
<P>Chapter Overview</P>
<P>Modeling and Experimental Uncertainties</P>
<P>Probabilistic Basis of Uncertainty</P>
<P>Identifying Sources of Error</P>
<P>Systematic and Random Errors</P>
<P>Quantifying Systematic and Random Errors</P>
<P>Measurement Uncertainty Analysis</P>
<P>Uncertainty Analysis of a Multiple-Measurement Result</P>
<P>Uncertainty Analyses for Other Measurement Situations</P>
<P>Uncertainty Analysis Summary</P>
<P>Finite-Difference Uncertainties*</P>
<P>Uncertainty Based upon Interval Statistics*</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Regression and Correlation</P></STRONG>
<P>Chapter Overview</P>
<P>Least-Squares Approach</P>
<P>Least-Squares Regression Analysis</P>
<P>Linear Analysis</P>
<P>Higher-Order Analysis*</P>
<P>Multi-Variable Linear Analysis*</P>
<P>Determining the Appropriate Fit</P>
<P>Regression Confidence Intervals</P>
<P>Regression Parameters</P>
<P>Linear Correlation Analysis</P>
<P>Signal Correlations in Time*</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Units and Significant Figures</P></STRONG>
<P>Chapter Overview</P>
<P>English and Metric Systems</P>
<P>Systems of Units</P>
<P>SI Standards</P>
<P>Technical English and SI Conversion Factors</P>
<P>Prefixes</P>
<P>Significant Figures</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Technical Communication</P></STRONG>
<P>Chapter Overview</P>
<P>Guidelines for Writing</P>
<P>Technical Memo</P>
<P>Technical Report</P>
<P>Oral Technical Presentation</P>
<P>Problems</P>
<P>Bibliography</P>
<P>A Glossary</P>
<P>B Symbols</P>
<P>C Review Problem Answers</P>
<P>Index</P>
<P>Introduction</P><STRONG>
<P>Experiments</P></STRONG>
<P>Chapter Overview</P>
<P>Experimental Approach</P>
<P>Role of Experiments</P>
<P>The Experiment</P>
<P>Classification of Experiments</P>
<P>Plan for Successful Experimentation</P>
<P>Hypothesis Testing*</P>
<P>Design of Experiments*</P>
<P>Factorial Design*</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Fundamental Electronics</P></STRONG>
<P>Chapter Overview</P>
<P>Concepts and Definitions</P>
<P>Circuit Elements</P>
<P>RLC Combinations</P>
<P>Elementary DC Circuit Analysis</P>
<P>Elementary AC Circuit Analysis</P>
<P>Equivalent Circuits*</P>
<P>Meters*</P>
<P>Impedance Matching and Loading Error*</P>
<P>Electrical Noise*</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Measurement Systems: Sensors and Transducers</P></STRONG>
<P>Chapter Overview</P>
<P>Measurement System Overview</P>
<P>Sensor Domains</P>
<P>Sensor Characteristics</P>
<P>Physical Principles of Sensors</P>
<P>Electric</P>
<P>Piezoelectric</P>
<P>Fluid Mechanic</P>
<P>Optic</P>
<P>Photoelastic</P>
<P>Thermoelectric</P>
<P>Electrochemical</P>
<P>Sensor Scaling*</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Measurement Systems: Other Components</P></STRONG>
<P>Chapter Overview</P>
<P>Signal Conditioning, Processing, and Recording</P>
<P>Amplifiers</P>
<P>Filters</P>
<P>Analog-to-Digital Converters</P>
<P>Smart Measurement Systems</P>
<P>Other Example Measurement Systems</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Measurement Systems: Calibration and Response</P></STRONG>
<P>Chapter Overview</P>
<P>Static Response Characterization by Calibration</P>
<P>Dynamic Response Characterization</P>
<P>Zero-Order System Dynamic Response</P>
<P>First-Order System Dynamic Response</P>
<P>Second-Order System Dynamic Response</P>
<P>Measurement System Dynamic Response</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Measurement Systems: Design-Stage Uncertainty</P></STRONG>
<P>Chapter Overview</P>
<P>Design-Stage Uncertainty Analysis</P>
<P>Design-Stage Uncertainty Estimate of a Measurand</P>
<P>Design-Stage Uncertainty Estimate of a Result</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Signal Characteristics</P></STRONG>
<P>Chapter Overview</P>
<P>Signal Classification</P>
<P>Signal Variables</P>
<P>Signal Statistical Parameters</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>The Fourier Transform</P></STRONG>
<P>Chapter Overview</P>
<P>Fourier Series of a Periodic Signal</P>
<P>Complex Numbers and Waves</P>
<P>Exponential Fourier Series</P>
<P>Spectral Representations</P>
<P>Continuous Fourier Transform</P>
<P>Continuous Fourier Transform Properties*</P>
<P>Discrete Fourier Transform</P>
<P>Fast Fourier Transform</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Digital Signal Analysis</P></STRONG>
<P>Chapter Overview</P>
<P>Digital Sampling</P>
<P>Digital Sampling Errors</P>
<P>Windowing*</P>
<P>Determining a Sample Period</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Probability</P></STRONG>
<P>Chapter Overview</P>
<P>Relation to Measurements</P>
<P>Basic Probability Concepts</P>
<P>Sample versus Population</P>
<P>Plotting Statistical Information</P>
<P>Probability Density Function</P>
<P>Various Probability Density Functions</P>
<P>Central Moments</P>
<P>Probability Distribution Function</P>
<P>Problems</P>
<P>Bibliography</P>
<P>Statistics</P>
<P>Chapter Overview</P>
<P>Normal Distribution</P>
<P>Normalized Variables</P>
<P>Student's t Distribution</P>
<P>Rejection of Data</P>
<P>Standard Deviation of the Means</P>
<P>Chi-Square Distribution</P>
<P>Pooling Samples*</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Uncertainty Analysis</P></STRONG>
<P>Chapter Overview</P>
<P>Modeling and Experimental Uncertainties</P>
<P>Probabilistic Basis of Uncertainty</P>
<P>Identifying Sources of Error</P>
<P>Systematic and Random Errors</P>
<P>Quantifying Systematic and Random Errors</P>
<P>Measurement Uncertainty Analysis</P>
<P>Uncertainty Analysis of a Multiple-Measurement Result</P>
<P>Uncertainty Analyses for Other Measurement Situations</P>
<P>Uncertainty Analysis Summary</P>
<P>Finite-Difference Uncertainties*</P>
<P>Uncertainty Based upon Interval Statistics*</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Regression and Correlation</P></STRONG>
<P>Chapter Overview</P>
<P>Least-Squares Approach</P>
<P>Least-Squares Regression Analysis</P>
<P>Linear Analysis</P>
<P>Higher-Order Analysis*</P>
<P>Multi-Variable Linear Analysis*</P>
<P>Determining the Appropriate Fit</P>
<P>Regression Confidence Intervals</P>
<P>Regression Parameters</P>
<P>Linear Correlation Analysis</P>
<P>Signal Correlations in Time*</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Units and Significant Figures</P></STRONG>
<P>Chapter Overview</P>
<P>English and Metric Systems</P>
<P>Systems of Units</P>
<P>SI Standards</P>
<P>Technical English and SI Conversion Factors</P>
<P>Prefixes</P>
<P>Significant Figures</P>
<P>Problems</P>
<P>Bibliography</P><STRONG>
<P>Technical Communication</P></STRONG>
<P>Chapter Overview</P>
<P>Guidelines for Writing</P>
<P>Technical Memo</P>
<P>Technical Report</P>
<P>Oral Technical Presentation</P>
<P>Problems</P>
<P>Bibliography</P>
<P>A Glossary</P>
<P>B Symbols</P>
<P>C Review Problem Answers</P>
<P>Index</P>