Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Published on 9. July 2023
Book
Paperback/Softback
XVI, 172 pages
978-981-19-3134-5 (ISBN)
Description
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
More details
Series
Edition
2022 ed.
Language
English
Place of publication
Singapore
Singapore
Target group
Professional and scholarly
Illustrations
27 s/w Abbildungen, 94 farbige Abbildungen
XVI, 172 p. 121 illus., 94 illus. in color.
Dimensions
Height: 235 mm
Width: 155 mm
Thickness: 10 mm
Weight
329 gr
ISBN-13
978-981-19-3134-5 (9789811931345)
DOI
10.1007/978-981-19-3132-1
Schweitzer Classification
Other editions
Additional editions
Xiong Du | Jun Zhang | Gaoxian Li
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Book
07/2022
Springer
€160.49
Shipment within 3-4 weeks
Persons
Xiong Du obtained his B.S., M.S., and Ph. D. degrees from Chongqing University, China in 2000, 2002, and 2005 respectively, all in the Electrical Engineering. He has been with Chongqing University since 2002 and is currently a full professor in the School of Electrical Engineering, Chongqing University. He was a visiting scholar at Rensselaer Polytechnic Institute, Troy, NY from July 2007 to July 2008. His research interests include power electronics system reliability and stability. He is a recipient of the National Excellent Doctoral Dissertation of P.R. China in 2008.
Jun Zhang obtained his B.S. degree from Anhui University, China, in 2014 and Ph. D. degree from Chongqing University, China, in 2019, all in the Electrical Engineering. He is currently working as a lecture in the College of Energy and Electrical Engineering, Hohai University, Nanjing, China. His research interests include the reliability of power electronics system.
Jun Zhang obtained his B.S. degree from Anhui University, China, in 2014 and Ph. D. degree from Chongqing University, China, in 2019, all in the Electrical Engineering. He is currently working as a lecture in the College of Energy and Electrical Engineering, Hohai University, Nanjing, China. His research interests include the reliability of power electronics system.
Content
Introduction.- Thermal fatigue failure mechanism of power devices in renewable energy system.- Thermal model and thermal parameters monitoring.- Thermal analysis of power semiconductor device in renewable energy system.- Multi-time scale lifetime evaluation for the device in the renewable application.- Thermal management design and optimization.- Prospect.