
X-Ray Optics and Microanalysis
Proceedings of the 20th International Congress
American Institute of Physics (Publisher)
1st Edition
Published on 4. June 2010
Book
Hardback
228 pages
978-0-7354-0764-0 (ISBN)
Description
ICXOM Series is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.
More details
Series
Edition
1., 2010
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Research
Illustrations
Illustrations
ISBN-13
978-0-7354-0764-0 (9780735407640)
Schweitzer Classification