
Pattern Recognition And Image Analysis: Selected Papers From The Ivth Spanish Symposium
World Scientific Publishing Co Pte Ltd
Will be published approx. on 1. January 1992
Book
Hardback
304 pages
978-981-02-0881-3 (ISBN)
Description
This volume contains 18 papers of high quality, selected to represent the work that is being developed by Spanish research groups in pattern recognition and image analysis. It is partly the result of the efforts of the Spanish Association for Pattern Recognition and Image Analysis (AERFAI). It is hoped that this volume will increase awareness of Spanish work in the international scientific community and initiate contacts with research groups worldwide.
More details
Series
Language
English
Place of publication
Singapore
Singapore
Target group
Professional and scholarly
Product notice
sewn/stitched
Cloth over boards
ISBN-13
978-981-02-0881-3 (9789810208813)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Persons
Editor
Univ De Granada, Spain
Institut De Cibernetica, Spain
Univ Politecnica De Valencia, Spain
Content
Part 1 Pattern recognition: synthesis and classification of 2-D shapes from their landmark points, N. Perez de la Blanca. Part 2 Image analysis and computer vision: projective invariants to identify polyhedric 3D objects, A. Sanfeliu and A. Llorens; non-supervised characterization of galaxies using different approaches, J.A. Garcia, et al; analysis and optimization of the k-Means algorithm for remote sensing applications, P. Montolio, et al. Part 3 Speech recognition: isolated word recognition based on multilayer perceptions, F. Casacuberta, et al. Part 4 Applications in image analysis and computer vision: analysis of gammagraphic images by mathematical morphology, A. Dupuy, et al; a new hybrid coding method for videoconferencing applications and ISDN, J. Zamora, et al; artificial vision applied to guidance of an autonomous robot, M. Mazo and D. Maravall, et al.